Used LTX-CREDENCE Fusion CX #9068404 for sale
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ID: 9068404
Tester
Includes:
Test head with adjustable RF connection
Mainframe
Linux Workstation "X" config dual boot
Flat panel monitor
(24) OVI Pins, 16 V, 550 mA/1A, 1 Cbit/Pin
(2) Digitizer pins, 14 Bit, 25 Ms/sec with burst IO
32 DDP Digital pins
Digital sequencer
Integrated time measure unit
Digital send and capture
(16) RF16B Ports
Base RF Subsystem with (3) R&S Generators
Even port auxillary RF R&S generator
Odd port auxillary RF R&S generator
Software: enVision++
Production options:
InTest or RAM Manipulator
Fusion UHIB2
Oneac 9.6 kVA Power conditioner
Site options:
DC CAL Standard
RF Power CAL Standard
RF Diag kit RND 22SMA with RFMSA
DP AC CAL Load board
Interconnect load board Std RF.
LTX-CREDENCE Fusion CX is a state-of-the-art final test equipment designed for advanced system-level industrial production test. It enables greater levels of diagnostic coverage and test time reduction to streamline test processes. LTX-CREDENCE FUSION CX offers a combination of TFCT (Total Fault Coverage Test) and structural test methods, allowing comprehensive fault coverage of large-scale electronics assemblies with unparalleled speed and efficiency. The unit utilizes a next-generation test engine and a field-programmable gate array (FPGA) integrated in the final test head, allowing for fast and accurate tests. The machine also features both port-based and flying-probe structural test technologies. Placing multiple closely-spaced test points on the same net allows concurrent testing on multiple nodes, resulting in significant speed increases while covering more nodes. The port-based test head also supports vectorless testing as the FPGA can replace vector-based algorithms for complex test applications. The order of tests and the execution of loops are controlled through a powerful script engine, and the possibility to couple vectorless and structural tests allows for time reductions of up to 90%. Fusion CX includes CheckpointFlex, a multichannel digital in-circuit test solution, which provides an advanced fault coverage as it can detect all open, short, and mixed faults in any combination. Additionally, it has a built-in die-level test mode, providing failure analysis capabilities. These tests are run against an on-board SoC, providing direct observations on the die, eliminating the need for external buses or external fixtures. The tool also allows for customizable diagnostic solutions, providing users with an integrated test environment that speeds up production test. IQ-View is a vivid and intuitive companion user interface, which provides the user with the ability to access detailed reporting of test results and failure analyses, as well as control of the test environment. Also included with the asset are an NPI-Flex, which provides access to test processes required for advanced NPI test and rapid validation. Together, all of these features provide users with the ability to test at both the board and model level for the most accurate results, increasing production yields significantly.
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