Used TERADYNE J750 #9167808 for sale

TERADYNE J750 Final Test equipment is an advanced, high performance test platform which utilizes an innovative network architecture to deliver high throughput and extensive data management in a cost-effective package. It is designed for high performance wafer-level, functional and final device test applications, like system-on-chip, memory and mixed-signal applications. Developed to provide greater test coverage and high device yield, TERADYNE J 750 combines the latest test approaches with an expandable, versatile and fault-tolerant platform. The test unit integrates a scalable network architecture which enables the user to access, store and manage large amounts of data with atypically high throughput. By allowing high channel parallelism, leading-edge tester speeds and large channel counts, it helps to increase the throughput of the test process. Furthermore, with the machine's distributed switch architecture, users are able to reduce test costs and create more controllable test programs. J750 also features a fully integrated, user-friendly software interface, which helps to streamline the tester setup. It enables efficient programming and fault diagnosis, so users can easily and quickly debug devices under test. In addition, it has advanced data analysis capabilities, allowing users to detect subtle defects in the device and tune the test specifically for those defects. The tool is equipped with a range of standard and advanced test technologies, making it a highly capable test platform. Its multitude of technologies includes time-aware capacitance measurements, which provide high accuracy measurements of complex analog and mixed-signal devices. It also includes advanced high-voltage technologies, which allow extensive testing of high voltage power devices. J 750 also has extensive onboard data storage, giving users resolution to save and replay test results. This allows them to enable in-depth process monitoring, as well as data correlations and diagnostic analysis. The asset is backed by TERADYNE expert team of test engineers, who provide additional support for custom test applications, serving as a valuable resource for all users. To conclude, TERADYNE J750 Final Test model is a versatile and powerful test platform, designed to provide maximum test coverage and device yield in a cost-effective package. It features an innovative network architecture, advanced test technologies, user-friendly software and onboard data storage. As such, it is an ideal equipment for a wide range of test applications, from wafer-level to functional and final device test.