Used TERADYNE J750 #9167876 for sale

TERADYNE J750 is a final test equipment used to validate a variety of components within the electronics industry such as semiconductor dies, integrated circuits, and system-level electronic assemblies. This unit is capable of helping designers to detect and diagnose various types of defects including parametric, electrical, and physical defects at high speeds. TERADYNE J 750 utilizes a unique combination of test technologies that help engineers achieve robust, reliable and fool-proof test performance. In terms of hardware implementation, J750 is composed of several major components. These include the central processing unit (CPU) that controls the actions of the machine, the tester body with the tooling slot, and the test cards used to interface with the target device. The test cards are available in a variety of types, including digital/CPLD/FPGA/ASIC, analog/MEMS/RF, and optical/X-ray/thermal. J 750 is programmed with the help of the GigaFlex ATE software, which has a graphical user interface (GUI) and an intuitive programming environment. This software features an advanced event control consists of sequencers, loopers, and routines that allow for sophisticated automated test program generation. Additionally, the software provides extensive libraries of commands and functions that allow for flexible test programing and debugging. The ability to accurately detect failures and diagnose issues with TERADYNE J750 is made possible by its various types of test instruments and measurement options. These include parametric tests such as DC, AC, and Noise measurements, as well as high speed pattern acquisition and functional waveform sampling. Additionally, TERADYNE J 750 supports a variety of advanced diagnostic tools such as Boundary Scan ATPG, JTAG/Boundary Scan, and In-Tool Programmability. Finally, J750 asset is also highly customizable. It can be tailored to the needs of the customer, with additional features such as a range of integrated power supplies, logic analyzer and waveform generators, as well as customizing features such as MIL-STD test standards, configurable handler options, and thermal stress fixtures to simulate environmental conditions. J 750 also included the powerful TERADYNE Easy Programming Language (TEPL), in addition to providing flexible plug-and-play interfaces to enable integration of customer's existing test software and assets. Overall, TERADYNE J750 is an advanced, high-end test model suitable for a wide range of applications in the electronics assembly and component validation industry. Its combination of test instruments and various measurement options makes it well suited for accurate detection and diagnosis of a broad range of defects, and the flexibility of the configurable testing options make it easily adaptable to most customer's needs.