Used TERADYNE J750 #9190314 for sale

TERADYNE J750 Final Test Equipment is a piece of semiconductor test and analysis equipment designed to accurately and efficiently test a variety of integrated circuit (IC) packages. It is capable of testing ICs quickly and accurately to identify and separate faulty parts from good ones. TERADYNE J 750 utilizes a comprehensive suite of software and hardware components to perform thorough testing on ICs. J750 features a series of pin-card boards which are used to interface with the IC under test. The pin-card contains a sophisticated set of digital and analog circuits. These circuits allow J 750 to accurately measure a variety of parameters on the IC, to detect any potential faults. TERADYNE J750 package also includes a specialized test controller - the 'Tetra-Link' - which guarantees that all of the pin-cards in the system are correctly configured for the test run. TERADYNE J 750 utilizes several sophisticated algorithms and software programs to generate the test profiles necessary for testing and analyzing ICs. The software provides an extensive set of tools to create, refine, and automate test runs. This enables the user to tailor their test protocol to the individual needs of each IC. J750 also comes with several GUI interfaces which allow the user to monitor and adjust their test parameters in real time. J 750 also includes powerful analysis modules which can be used to identify the cause of discovered faults. These modules are capable of performing simulations in both time and frequency domains, to produce an accurate and comprehensive fault characterization. The unit also includes various data visualization techniques to help the user interpret and analyze their test results. TERADYNE J750 Final Test Machine provides an excellent solution for quickly testing and characterizing modern semiconductor devices. Its robust set of software and hardware components allows users to thoroughly and accurately test their ICs, which can ultimately lead to a lower rate of device failure.