Used NISSIN NH-20C #9151331 for sale

NISSIN NH-20C is an ion implanter and monitor, which is a highly accurate device that consists of a particle acceleration unit and an ion monitoring unit. This device is equipped with advanced ionization technology, making it suitable for a wide range of applications, such as research and development in semiconductor technology. The particle acceleration unit, which is responsible for the implantation of ions, is composed of two main components—the injectors and the extractors. The injectors allow ions to be injected into the target material, while the extractors draw in the ions after implantation. The injectors and extractors can be adjusted according to the type of application, and the power of the acceleration can also be regulated to meet the needs of different research and development processes. The ion monitoring unit incorporates a Faraday cup to measure current in the electron beam for the purpose of pinpointing the location of the particles. This allows researchers to precisely control the dose and energy of the particles implanted into the target material. It also allows researchers to assess the damage and distortion caused by the particle beam. The Faraday cup can detect even the smallest changes in electric current, allowing for the highest level of accuracy possible. NH-20C has been designed with a highly sensitive imaging system that ensures the ions implanted into the target material are evenly distributed throughout. This imaging system consists of an optical microscope for enhanced detection and a charge coupled device (CCD) camera for image analysis. The user interface allows researchers to easily configure the device so they can adjust the power, the current, and the characteristics of the beam. Researchers can also use the interface to display the results obtained in real-time, view graphs and charts, and save data for further analysis. In summary, NISSIN NH-20C is an ion implanter and monitor that is equipped with advanced ionization technology, which is suitable for a variety of applications, such as research and development in semiconductor technology. The particle acceleration unit can be adjusted according to the type of application, and the ion monitoring unit incorporates a Faraday cup to measure the current in the electron beam for precision control. The device also features an optical microscope and a CCD camera for enhanced imaging, as well as an intuitive user interface that allows for easy configuration and result analysis.