Used TAYLOR HOBSON TalySurf CCI 9150 #9168261 for sale
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ID: 9168261
Non-contact 3D profiler
Vertical resolution: 0.1Å (0.01 nm)
Measurement noise: 0.2Å (0.02 nm)
Data points as standard: >1,000,000
Single measurement mode of operation
RMS Repeatability: 0.03Å (0.003 nm)
Measurement technique:
Coherence correlation Interferometry
Vertical range (Z): 100μm
Vertical resolution: 0.01nm [0.1Å]
Noise floor (Z): 0.02nm [0.2Å] 1
Repeatability surface RMS (Z): 0.003nm [0.03Å]2
Measurement area (X, Y):
0.25mm - 7.0mm (square area)
1024 x 1024 standard measurement points
Optical resolution (X, Y): 0.4 - 0.6μm
Step height repeatability: 0.05nm (25 nm step) / 0.1%
Linearity (Z): 0.03% of measured value
Surface reflectivity: 0.3% - 100%
Measurement time: 5-20 seconds.
TAYLOR HOBSON TalySurf CCI 9150 is a mask and wafer inspection equipment designed for the semiconductor industry that uses the latest in non-contact optical profilometry technology to enable fast and accurate measurements and analysis of semiconductor wafers. This system is equipped with a patented dynamic focusing unit that allows for a range of measurement from 0.5 to 500mm, making it ideal for different sizes of wafers. The CCI 9150 features a low noise capability of 1.5nm and a high resolution option of 0.05um that allows the user to get accurate results. This machine also has an automated data collection that can gather data from multiple wafers in one pass, reducing the amount of time needed to inspect each wafer. With the use of advanced imaging techniques, the tool can analyze master wafer flatness, step heights, yields, and other variables. This helps to improve the accuracy of the wafers and provide reliable repeatable measurements. The Talysuf CCI 9150 is designed to reduce production costs by providing efficient measurement and analysis of wafers. This is done by providing data that can be wirelessly shared with production teams or remotely accessed for review. The automatic feature comparison helps to identify any differences between the product after production, saving valuable time by detecting defects before they are shipped out. The asset is designed for other operations such as manual measurements, multi-layer wafer mapping, and data analysis. By using advanced software features, the CCI 9150 can further analyze wafers with better accuracy and better results than traditional methods. Overall, TalySurf CCI 9150 is an ideal tool for producing and analyzing wafers. By using the cutting-edge optical profilometry technology, the CCI 9150 can provide reliable and accurate measurements and analysis of wafers. The model's automated features and data collection capabilities reduce production costs while providing a reliable and repeatable way to measure and monitor wafers.
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