Used AMAT / APPLIED MATERIALS Compass Pro 300 #293607489 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

ID: 293607489
Wafer Size: 12"
Vintage: 2003
Wafer inspection system, 12" Z-T Assembly ATOC Wave generator NT1 NT2 AOD1 Tube1 Tube2 Tube3 Tube4 (6) Detectors ASYST Robot Bilz controller Laser controller Laser head Shutter wheel Lambda 2 module assembly Objective slider IDP Motor wiring Continuous filter D-Link Review head Mask motor Missing parts: FI Power supply FI Computer HDD RF Amplifier ACS LFS NT3 OM Lamp house Stage cable (One-axis) Stage controller Chiller Console main computer Repl unit servo assembly Rocket port Hub Power supply: PBC Servo (4) Detectors NT3 2003 vintage.
AMAT / APPLIED MATERIALS Compass Pro 300 is a high resolution mask and wafer inspection equipment. This system provides aerial and in-focus imaging of wafer samples with an accurate and reliable methodology and fast acquisition times for complete inspections. The unit is suitable for use in a variety of inspection scenarios, such as the automated inspection of fab parameters, and CRM inspection. AMAT Compass Pro 300 includes a controller, stepper motor, and motion control stage, as well as a user-friendly touchpanel display for easy operation. It also offers a high power diode-pumped solid state (DPSS) laser, with a wide wavelength range of 370 to 1050 nm and a high repetition rate of 10 kHz. The 2 x 2" or 4 x 3" fields of view combine with PIN diode and IRCCD camera sensors to enable in-focus imaging with resolutions down to 1 μm. Furthermore, the CCD cameras provide 256 gray levels and 4ms exposure times in full field. The machine features an automated multiple run mode to ensure accurate and repeatable parameter scans, while the active illumination control tool allows adjustable operating parameters such as laser power and scanning speed. Software options include both manual and automated control modes, as well as an automated defect detection and classification asset, to deliver fast and accurate inspection results. The model is also equipped with an optional die-level inspection (DLI) sample stage, which provides the ability to inspect die-level components with ease. The DLI equipment includes sample handling automation, automated wafer stage centering and surface tracking, as well as die-level autofocus and defect analysis. Furthermore, APPLIED MATERIALS Compass Pro 300 comes with a variety of accessories, including lens and filter turrets for producing high polarization contrast SV images, a front-end lens, a beam sampler, an attenuator, and an optional thermal plate. This system is available in a protective atmosphere version, suitable for inspecting critical components under a controlled atmosphere. Compass Pro 300 is a user-friendly unit, designed to deliver precise and reliable results in the fast and accurate inspection of both masks and wafers. It enables a variety of inspection scenarios, with optional die-level inspection and a range of accessories, all in a compact machine that fits into existing fab environments. The high resolution imaging, fast acquisition times and automated process control make this ideal for a variety of inspection requirements and promises to revolutionize the inspection of critical components.
There are no reviews yet