Used AMAT / APPLIED MATERIALS Compass Pro 300 #9235264 for sale

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ID: 9235264
Patterned wafer inspection system Sun UltraSparc (10) Unix workstations (RAM: 1GB, 40 GB) HD With spare SCSI card and 20/40 GB tape drive 1140-A0291W / J20-8S-12K-24 1140-A0291W / J20-8S-12K-23 Spectra-physics 0412-0515 US / 0135-0968 Rev B ASYST C0094-0948-01 ASYST 6900-1551-01 FI computer SmartPlus 1.83 100395-0311/00 Rev C / Cable X-axis motor encoder hall SKU-G7-K-2317-1 Master IP computer 1951608 / IP1 Genesis camera interface cable 1951363 / 740-26817-AD IP1/ADC1, 0090-A0780 ACS DR14 Rev B2 Compass 300 X-Axis driver PCB 370-1586-03 / NESUN1 Sun compact mouse Cooling fan sparcstation: 12 V ANORAD Commutation x,y sq box Rocketport interface bd in FI computer ASYST IsoPort, 300 mm (LP B) ASYST 2200 LP with MOCA (200 mm) Video card in Sun Sparcstation (2) computers Aligner and stage to FA blade Light from SP laser head: 532 nm Light laser diode: 808 nm LP Cassette ID (Port A and Port B) communications Rocket port interface board Back-up tapes and sun solaris Sparcstation (2) PC OLYMPUS Microscope with white light lamp, 50 W 4610 HLX, 50 W, 12 V SP Laser head: 532 nm (light) Ultra-Sparc (10) unix workstation RAM: 1 GB (HD: 40 GB) Laser detectors: 1.1 W, 28.5 A / 16.5 Degree Cd Laser output: 2.4 W, 31.92 A / 16.42°C Laser diode (current very high) Laser head and diode testing Rocketport breakout box has been replaced (4) FFU Fans 6900-1551-01 SmartPlus 1.54, Patch 1, OS NT4.0, SP 6 Compass 300 X-Axis motor hall encoder cable, 25" Master IP computer Compass 300 Dark field detector With IP1 Computer cable and (2) detectors EDR PMT Detector assy X-Axis driver board Sun compact mouse with live host tool Does not include camera IP1 interface cable.
AMAT / APPLIED MATERIALS Compass Pro 300 is a mask and wafer inspection equipment designed to help working within the semiconductor industry. This system provides deep metrology examination and imaging of structures on masks and wafers. This unit's control software, Comprehensive Wafer Inspection (CWI), gives the user the ability to inspect both patterned and unpatterned wafers and inspect them thoroughly through a comprehensive metrology and imaging platform. The machine is made up of two integrated components which are the tool's console and its imaging station. The console houses the asset's motorized stages which control the position of the specimen and provides, vacuum, compressed air, and other necessary gases. This component also contains the probing and imaging elements of the model for precise measurements and imaging. The imaging station contains a high-resolution CCD (Charge-Coupled Device) camera that is used to capture and qualify structures or features on specimen surfaces. The equipment is designed to use optical techniques to examine semiconductor shapes and patterns via measurements and imaging capabilities. It can be used for identifying the misalignments and variations of critical dimensions over the entire specimen as well as for defect detection. It can also run Light Source Focusing Algorithms (LSFAs) in order to analyze wafer images. The topography of the specimen and its structures can be measured by the system using a combination of optics and laser interferometry which creates a 3D micrograph of the sample surface in order to view microstructures. The unit's sensors and detectors aid in identification, confirmation, and analysis of undesirable defects on the specimen. The machine is also equipped with specialized tools for automated failure analysis and repair tracking. AMAT Compass Pro 300 is a powerful tool that provides reliable, accurate, and repeatable results for inspection of both masks and wafers in the semiconductor industry. Its advanced control software and comprehensive inspection capabilities makes it a great tool for quality assurance and production control. It's compact size and ease of use make it well suited for most labs and production facilities.
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