Used AMAT / APPLIED MATERIALS Compass #9195370 for sale

AMAT / APPLIED MATERIALS Compass is a mask & wafer inspection equipment used in the fabrication of semiconductor devices. It is a high-throughput inspection platform that offers integrated optical and electrical testing capabilities. This system is capable of inspecting the quality of masks, wafers and other components in large-scale semiconductor manufacturing. The unit is composed of a multi-axis automated microscope, a CCD/CMOS camera, a high-speed motion control machine, an image processor, a feature recognition unit and a wafer substrate holder. The microscope is used to inspect the structures of the masks or wafers, while the camera captures images of each feature. The image processor then performs a single-pass feature recognition on each image captured by the camera, which allows the tool to identify potential defects. The motion control asset allows the microscope to accurately scan masks and wafers in both a standard manual inspection mode (accomplished by a user-defined area) and a repetitive mode (which uses automated templates). This allows for efficient scanning of large areas in minimal time. In addition, AMAT Compass incorporates advanced capabilities offering precision in detecting obscure, hard-to-detect defects as well as user-defined threshold for alerting. Additionally, it features enhanced defect logging and reporting abilities that enable data mining for further analysis. The model also features a wafer substrate holder that allows for easy sample loading and unloading, as well as multi-level sample holders for moving heavy samples. The equipment is also capable of inspecting and correcting multiple defects, patterning, and alignment. Furthermore, this system is certified with numerous test standards and can be configured to meet the exact testing needs of any application. APPLIED MATERIALS Compass is an all-in-one, high-throughput unit designed to increase overall inspection accuracy and process speeds. This platform is ideal for both mask and wafer inspection as well as other device fabrication projects. Its combination of advanced features and capabilities allows manufacturers to maintain a high-level of quality throughout the process.