Used AMAT / APPLIED MATERIALS / ORBOT WF 720 #9093244 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

AMAT / APPLIED MATERIALS / ORBOT WF 720
Sold
ID: 9093244
Defect metrology systems
AMAT / APPLIED MATERIALS / ORBOT WF 720 is a mask & wafer inspection equipment designed to quickly identify, analyze and characterize defects in semiconductor solutions. The system is equipped with advanced optics and algorithms, allowing users to accurately identify and measure defects. It is also capable of detecting very small particles and can detect and differentiate between feature-level and wafer-level defects on a microscopic level. AMAT WF 720 boasts a broad range of features that make it an ideal choice for inspection solutions. Its wide field of view, advanced imaging optics and algorithms allow for precise and accurate analysis. The unit's automated process control capabilities ensure that the same results are achieved with each inspection. ORBOT WF 720 also features a long life LED illumination machine that provides stable illumination for accurate analysis across both mask-level and wafer-level regions. WF 720 supports a wide range of materials, including silicon, gallium arsenide, gallium nitride, gallium phosphide, aluminum gallium arsenide, Kapton, quartz, and many more. Its non-contact, non-destructive operation is also ideal for analyzing samples quickly and efficiently. It is capable of analyzing defects as small as 10nm and with a resolution of up to 32x magnification. For defect-free wafers, APPLIED MATERIALS WF 720 can be used to quickly identify tiny particles on the mask and at the wafer level. The tool employs deep learning algorithms to effectively detect, identify and categorize defects. This helps the user to accurately determine defect location and cause quickly and accurately. Overall, AMAT / APPLIED MATERIALS / ORBOT WF 720 is a versatile, high-precision mask & wafer inspection asset that provides easy-to-use and reliable analysis solutions. Its wide range of features and advanced algorithms make it a great choice for any semiconductor inspection solutions.
There are no reviews yet