Used AMAT / APPLIED MATERIALS SemVision CX #9249577 for sale

AMAT / APPLIED MATERIALS SemVision CX is a cutting-edge mask and wafer inspection equipment designed to provide superior pattern defect inspection speed, accuracy and reliability. Through an advanced illumination system, a 12 mega-pixel CCD sensor, and a powerful embedded processor, this unit offers exceptional wafer and mask inspections with high sensitivity. The machine offers advanced wafer defect analysis, critical feature analysis, and defect classification and trending, with throughputs up to 50 wafers per hour. Features include high-resolution imaging and embedded inspection algorithms, automated background feature recognition, full-field defect analysis, macro and micromodule inspection, and manual review of the inspection images with quick and easy selection of relevant data. AMAT SemVision CX utilizes dual laser design for absolute imaging and defect detection, ensuring uniform depth of focus and improved accuracy and precision. The dual laser design enhances sensitivity, reliability and accuracy of the inspection process. It uses advanced object/edge recognition technology to accurately detect and identify defects even in challenging condition such as poor contrast, high dynamic range, and a variety of defect sizes. Additionally, the tool offers automated die-level scaling, allowing images to captured accurately and automatically. By using powerful image processor, the asset is able to quickly process high-resolution images and perform pattern recognition. APPLIED MATERIALS SEM VISION CX model provides precise fine-grain defect localized inspection feature within the imaging chip, allowing highly precise measurements and defect mapping. It also offers wireless data transmission technology eliminating the need of desktop interaction and providing enhanced flexibility and convenience. In conclusion, SEM VISION CX is an advanced wafer and mask inspection equipment, offering superior sensitivity, accuracy, and reliability. With its high-speed inspections, precise defect detection capabilities and cutting-edge technology, this system is the ideal choice for any modern semiconductor production line.