Used AMAT / APPLIED MATERIALS SemVision G2 Plus #9374700 for sale

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ID: 9374700
Wafer Size: 12"
Vintage: 2003
Defect review system, 12" CIM: SEC GEM Process: Metrology Handler Factory interface: (2) FOUPs (2) BOCVAC Pumps Uninterruptible Power Supply (UPS) A-Box 2003 vintage.
AMAT / APPLIED MATERIALS SemVision G2 Plus is a mask and wafer inspection equipment designed to ensure the highest levels of accuracy when inspecting and detecting defects on wafers and masks——even defects as small as just 1 micron. The system uses advanced colour transfer technology to accurately inspect masks and wafers and can transfer defect images to the majority of colour supported printers. The unit supports multiple tools, such as Tandem, darkfield and brightfield to accurately detect various defects on the wafer and mask. It also supports stitching of multiple die inspection to meet the increasing die-to-die requirements of semiconductor processing. Its advanced post-processing capabilities also enhance fault detection accuracy. The machine includes custom designed optics, such as multiple zone autofocus and autocentre features, which provides excellent resolution data. It also includes custom designed image magnification systems which can increase the magnification up to 250X with up to 8 images per minute in 16 bits. It uses specialised filtering and image enhancement techniques to produce high-contrast images with improved defect resolution. AMAT SemVision G2 Plus includes a powerful image handling capability that can detect a wide range of defect types on wafers and masks. Its fully automatic mask inspection mode processes images in real-time, and its intuitive user-interface makes it easy to use. In addition, the tool provides customised analyses for a variety of mask types and features an advanced defect recognition module to enable fast and accurate defect diagnosis. In addition, it features a multi-deck imaging asset for defect counting and analysis. It can detect up to 4 levels of defects and its defect manipulation capabilities can detect open defects, shorts, bridging, solderballs, stress cracks, and other types of defects. Its integrated automation control model provides support for both manual and automated operations. It also includes an advanced software suite for engineering and quality control. In addition, the equipment supports multiple file formats, such as standard TIFF and JPEG, to ensure compatibility with other industry-standard systems. Finally, APPLIED MATERIALS SemVision G2 Plus includes advanced system-level reliability features, such as redundant power supply and components to ensure reliable operation. It also includes a customer support package, providing online and telephone support for customers.
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