Used AMAT / APPLIED MATERIALS SemVision G2 #9269339 for sale

AMAT / APPLIED MATERIALS SemVision G2 Mask & Wafer Inspection Equipment is the top of the line system for advanced imaging and inspection of integrated circuit masks and semiconductor wafers. This versatile unit is designed to meet the highest standards of accuracy and performance, capable of inspecting Mask, Wafer and JPEG images with high efficiency and accuracy. The advanced imaging capabilities offered by AMAT SemVision G2 machine offer operators the ability to drag-and-drop different inspection parameters, adding unparalleled ease-of-use to the device. The main feature of the tool is its ability to detect defects within the design areas of a mask or wafer, or on the actual chip surface. APPLIED MATERIALS SemVision G2 has advanced pixel resolution of up to 1024 pixels per inch and advanced defect recognition algorithms that can detect sub-pixel sizes and critical defects such as vias and particles. In addition, the asset includes a library of microscope images providing operators additional detail and features such as 3D view and splitting movies. SemVision G2 is also equipped with an integrated automated phase-shift scanning technology that allows operators to quickly and accurately inspect the registration and phase accuracy of masks. Along with its customizable field of view, flexible illumination, and innovative defect categorization features, users have the ability to quickly detect and isolate critical defected areas. The model includes a suite of software packages that are designed to facilitate quick and efficient defect review, advanced defect tracking, precise reporting, and customizable image viewing. The software coupled with the intuitive user interface of AMAT / APPLIED MATERIALS SemVision G2 makes it easy to use for experienced and inexperienced operators. AMAT SemVision G2 Mask & Wafer Inspection Equipment is designed to provide the highest standards of imaging, inspection, and analysis available on the market. With its high resolution, automated feature recognition capabilities, and user-friendly interface, the system is the ideal choice for semiconductor manufacturers and integrated circuit designers.