Used AMAT / APPLIED MATERIALS SemVision G3 #9261413 for sale

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AMAT / APPLIED MATERIALS SemVision G3
Sold
ID: 9261413
Wafer Size: 12"
Vintage: 2011
System, 12" 2011 vintage.
AMAT / APPLIED MATERIALS SemVision G3 is a mask and wafer inspection equipment designed to help reduce errors in the production of microelectronic components. The system utilizes high-resolution digital imaging technology and advanced pattern recognition software to quickly and accurately identify imperfections on the mask, wafer surfaces, and other structures. AMAT SemVision G3 offers several advantages to users. One of the most important advantages is its robust and efficient automated feature recognition and inspection quality analysis capabilities. This unit can detect surface imperfections as small as 0.03 microns, making it ideal for inspecting masks, wafers, and other microelectronics components. Additionally, the machine is capable of performing multiple measurements, such as edge detection and linearity tests, in an efficient and automated manner. The user interface of APPLIED MATERIALS SemVision G3 is simple and intuitive. The display includes several advanced control functions such as zoom and pan functions, selection of preset profiles for wafer inspection, and automated data collection. With the tool, users have complete control over the inspection process, allowing them to check results quickly and make necessary adjustments accordingly. SemVision G3 is also equipped with several additional features that make it an attractive option for mask and wafer inspection applications. These features include optically isomeric imaging, which eliminates the possibility of cross-talk between different channels, as well as multiple defect inspection tools for detecting and categorizing different defects in the microelectronic components. In addition, the asset offers high-level automation for enhanced performance and repeatability during successive inspection runs. Overall, AMAT / APPLIED MATERIALS SemVision G3 is an extremely reliable and efficient mask and wafer inspection model. By incorporating high-resolution digital imaging, advanced pattern recognition software, and a range of additional automated features, it allows users to inspect a wide range of microelectronic components in an efficient and accurate manner. For these reasons, AMAT SemVision G3 is a great choice for any mask and wafer inspection requirement.
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