Used AMAT / APPLIED MATERIALS UVision 200 #9158469 for sale

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AMAT / APPLIED MATERIALS UVision 200
Sold
ID: 9158469
Wafer Size: 12"
Vintage: 2005
Inspection system, 12" (2) Load port Resolution: 80nm Configuration and optional: Pixel sizes: 0.08, 0.12, 0.16, 0.22, 0.26, and 0.6um BF & GF Laser illumination (DUV)+ PMT detection 2005 vintage.
AMAT / APPLIED MATERIALS UVision 200 Mask and Wafer Inspection Equipment is a full-field inspection system that offers full-field imaging and analysis of wafers and reticles. This state-of-the-art unit is designed to quickly and accurately detect and analyze defects on current semiconductor fabrication process steps, including all available lithography technologies. This machine incorporates a variety of advanced digital imaging technologies, such as FITS, which allows high-resolution combined imaging, the reliable high-speed imaging optics, plus the integral wafer and reticle alignment capabilities. AMAT UVision 200 tool provides a high-throughput imaging and analysis asset with unlimited field capability. By combining the high-resolution imaging with an integrated ultrahigh-level shape analysis algorithm, the model is capable of quickly and accurately locating and identifying even the smallest of defects. With its high-resolution imaging, state-of-the-art analysis algorithms, and fast inspection speed, APPLIED MATERIALS UVision 200 allows semiconductor workers to identify faults quickly and avoid costly repairs or delays in manufacturing. To ensure accurate and reliable results, UVision 200 equipment is equipped with a series of specialized alignment functions that help ensure consistent image quality across the wafer and reticle fields. The system is equipped with automated optical alignment which helps adjust the optical alignment parameters and ensures precise alignment of the inspected object to the imaging tool. Moreover, the unit allows for manual access to the alignment controls which further ensures accuracy. Furthermore, the machine is designed to quickly analyze defect data with its high-performance image analysis capabilities. The tool leverages a unique imaging tool which provides comprehensive image information and detects even the shortest defects. The asset is also equipped with an advanced auto-analysis feature which helps to quickly analyze defect data without manual intervention. AMAT / APPLIED MATERIALS UVision 200 is an ideal imaging and analysis model for semiconductor processes as it is designed to perform precise and reliable inspections for current and future processes. Its advanced imaging, analysis, and alignment capabilities help semiconductor workers reduce their costs and minimize faulty manufacturing.
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