Used CRYSTAL 4095-1E #9392981 for sale

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ID: 9392981
System.
CRYSTAL 4095-1E is a mask and wafer inspection equipment manufactured by JEOL, a leading provider of advanced electron-beam microscopy products and services. 4095-1E is designed to meet the needs of the most demanding inspection applications by combining the latest scanning electron (SEM) and atomic force (AFM) microscopes. CRYSTAL 4095-1E features a powerful scanning electron microscope for sub-micron defect detection on large circuit wafers. With its three-axis micropositioner, the system offers high-precision measurements at the highest level of accuracy. The unit also includes a high-resolution image acquisition machine with automatic dynamic focus for improved defect identification. In addition, 4095-1E's advanced atomic force microscope enables nanometer-scale defect detection on wafers beyond the reach of SEM. The tool includes a high-resolution imaging asset and auto-stitching software to allow for faster data acquisition and improved defect detection. CRYSTAL 4095-1E also offers a high-performance microscope light source for high-contrast imaging and advanced resolution. It includes a proprietary model vision software for automated pattern-based defect detection. The software has been carefully calibrated to detect adhesion, roughness, and other defects arising from the fabrication of complex structures. In addition, the equipment integrates with an external image processing system to enhance image quality and enhance usability. The unit's intuitive touch screen display allows users to easily adjust machine parameters and conduct data analysis quickly and effectively. 4095-1E provides a powerful and versatile tool for performing mask and wafer inspection. With its advanced scanning electron and atomic force microscopes, high-resolution imaging systems, and sophisticated software, CRYSTAL 4095-1E is designed to meet even the most demanding mask and wafer inspection applications.
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