Used ESI / MICROVISION 882 #9104381 for sale

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ESI / MICROVISION 882
Sold
ID: 9104381
Lead inspection system.
ESI / MICROVISION 882 Mask & Wafer Inspection Equipment is a world-leading metrology and imaging technology designed for defect analysis in the semiconductor industry. Its features include non-contact imaging and automated defect detection, providing unparalleled accuracy when used to detect and measure problems with mask and wafer surfaces, resulting in significant reduction of time to process and analyze production lots. ESI 882 utilizes two components to provide an advanced defect recognition architecture. The first is an optics system which provides a high-resolution magnified image of the surface thereby allowing for accurate identification of even the subtlest irregularities or defects. The second is a defect detection algorithm which utilizes a neural network to scan the image for the presence of defects and then classify them according to their respective characteristics. MICROVISION 882 Mask & Wafer Inspection Unit offers a wide range of features, enabling users to tailor the machine to their particular needs. It supports both manual and automated operations, incorporating three illumination options for optimal analysis, namely Visible, UV and Infrared modes. It also offers the choice of several large-format sensors and a variety of pattern recognition capabilities. The tool can be used on a variety of substrates, from metal to optical materials, and can determine defect sizes ranging from µm, in both the planar and vertical dimensions. In addition, it is equipped with magnification capabilities of up to 1000X, providing excellent resolution for defect identification. 882 Mask & Wafer Inspection Asset also comes with an intuitive user interface which grants easy access to the various software functions. It is equipped with advanced graphical tools for displaying results, enabling users to spot defects more easily, plus it also offers 'Operator Analysis Assistance' which provides intuitive guidance, greatly facilitating the scanning and classification of defects. With ESI / MICROVISION 882 Mask & Wafer Inspection Model, users can enjoy an advanced and reliable defect detection technology which is tailored to the needs of their particular industry. It provides a great platform for semiconductor manufacturing, helping reduce defects and production costs by streamlining the analysis and optimization processes.
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