Used HERMES MICROVISION / HMI eP3 #9285021 for sale

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HERMES MICROVISION / HMI eP3
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ID: 9285021
E-Beam inspection system.
HERMES MICROVISION / HMI eP3 is a mask and wafer inspection system, aimed to meet the most demanding semiconductor production requirements. It's capable of providing the highest precision measurements and metrology tests for all types of mask and wafer production. HMI eP3 is ideal for applications such as optical wafer review, defect analysis, lithography inspection, yield management and optical review of patterned wafers. Its automated image acquisition and processing technology is able to detect any unforeseen errors and process them with accuracy. HERMES MICROVISION eP3 is equipped with intelligent imaging capabilities and a powerful illumination system, with a variety of software tools to adjust the capture of digital images, as well as the range and accuracy of measurements. This ensures that mask and wafer defects are accurately assessed and flagged for further inspection. EP3 is supported by the HERMES MicroImage software suite, which is designed to provide a comprehensive approach to image analysis and defect review. This software suite offers a variety of predefined image views including vertically/horizontally/diagonally flipped images, contrast enhancements, magnified images or expanded views to provide a detailed analysis of the results from the inspection. Furthermore, HERMES MICROVISION / HMI eP3 offers superior optics and a higher sharpening rate for image resolution, allowing for adjustment of exposure time based on the uniformity of sample luminance. This optimizes the exposure limit range and improves the accuracy of image captures. In addition, HMI eP3 comes with an intuitive user-friendly interface, providing operators with all the necessary instruments to access and change settings with ease. Its user-labeled features and shortcuts guarantees operational time-saving on installation and execution. To summarize, HERMES MICROVISION eP3 is a comprehensive and reliable mask and wafer inspection system with a wide variety of features and capabilities, making it ideal for semiconductor production. Its automated image acquisition and analysis makes it capable of providing accurate and reliable results. Additionally, its user-friendly interface ensures a quick and straightforward setup process.
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