Used HERMES MICROVISION / HMI eScan 320 #9285023 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

HERMES MICROVISION / HMI eScan 320
Sold
ID: 9285023
E-Beam defect inspection system.
HERMES MICROVISION / HMI eScan 320 is a high-performance mask and wafer inspection equipment that combines the power of MicrovisionHMI next-generation optics and image processing technologies with its innovative lighting and illumination technologies. This is a superior solution for verifying substrates, masks, and other microelectronic components at the finest levels of detail. HMI eScan 320 is capable of imaging the components of any patterned substrate with precision and accuracy. Its innovative design features a low-noise optical tuning system and high-accuracy scanning, providing precise measurements of the object's structure. This reduces the time and costs of critical defect detection and analysis. This is especially important for inspection of objects such as wafers and masks, which can have intricate features and must meet high standards of accuracy. HERMES MICROVISION eScan 320 uses precision scanning tools such as multiple focus technology and dynamic alignment of megapixel cameras. This ensures that every feature on the object is accurately scanned and analyzed. The unit's lighting and illumination technologies enable uniform illumination of the object. EScan 320 also offers in-depth image capture and manipulation capabilities, so you can quickly detect and analyze the most challenging defects. In addition to its high level of accuracy, HERMES MICROVISION / HMI eScan 320 is also highly reliable. Its active temperature management machine is designed to maintain optimal temperature levels during inspection, and its air filtration tool ensures low contaminants and dust levels. The strong and robust construction of the asset ensures high levels of durability and longevity. HMI eScan 320 is the perfect solution for the most demanding mask and wafer inspection applications. Combining advanced optics with unique illumination and image processing technologies, it offers precision and accuracy that few other systems can match. Its reliable and robust design is perfect for inspecting delicate microelectronic components, while its low-noise scanning capability ensures critical defects are accurately detected and analyzed.
There are no reviews yet