Used JEOL JBX-9300FS #9246062 for sale

JEOL JBX-9300FS is an advanced scanning electron microscope (SEM) designed to provide high resolution imaging with a wide range of features. With enhanced performance and robust construction, JBX-9300FS is capable of taking scanning electron microscope images with resolution down to 0.7nm. Its Electron Optics provide distortion-free imaging even at very high magnifications. It also features a Spectra Analysis mode, allowing it to analyse the elemental composition of a sample down to a single atomic layer. JEOL JBX-9300FS offers a large spatial resolution, with a field of view up to 10 μm and a resolution of 0.7 nm. It includes a professional anti-vibration system to ensure smooth and stable focusing at maximum magnifications. The microscope is also equipped with a range of detector options, including a Faraday Detector for measuring energy dispersive X-rays (EDS) and a Backscattered Electron Detector (BSE) for atomic scale imaging. JBX-9300FS is capable of low vacuum mode operations (LVME) down to 0.5 Pa, making it ideal for studies that require high beam currents and high resolution imaging of materials having a low secondary electron signal. The Lithium Molybdate Chamber allows JEOL JBX-9300FS to take SE/BSE images up to a maximum pressure of 100 Pa. Furthermore, it includes a low emission electron Gun, allowing it to image sub-nanometer features with minimum secondary electron background noise. In addition, JBX-9300FS features a unique detector options, including a Spot Square Detector and Energy Focusing Detector. The Spot Square Detector captures images and produces pixel maps of the sample, while the Energy Focusing Detector is used to measure EELS spectrum line shapes. It also includes an advanced system for automated operation, allowing it to operate in automated sample changer cycles, thereby improving overall productivity. Overall, JEOL JBX-9300FS is an highly advanced and powerful scanning electron microscope, with a range of features designed to provide high resolution imaging with advanced performance and robust construction. This versatile instrument is perfect for a range of applications, including materials science, nanotechnology and semiconductor research.