Used KLA / TENCOR 2350 #9233085 for sale

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KLA / TENCOR 2350
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ID: 9233085
High-resolution imaging inspection systems.
KLA / TENCOR 2350 mask and wafer inspection equipment is a state-of-the-art system designed to help ensure quality assurance processes in today's advanced semiconductor fabrication facilities. The unit is designed to provide highly accurate detection, measurement, and analysis of electrical and geometrical defects on product masks and wafers in both front and backside inspection capabilities. KLA 2350 utilizes a wide range of highly advanced technologies, including: advanced optical inspection capabilities, high-resolution image sensing systems, advanced defect review systems, and proprietary analyze and review software. This combination of technologies enables TENCOR 2350 to quickly detect and analyze defects with unparalleled speed and accuracy. 2350's advanced optical inspection capabilities provide powerful, high resolution imaging resolution and automated edge detection capabilities. This capability allows for the accurate image and analysis of defects such as shorts, opens, mask gaps, and more. KLA / TENCOR 2350 also features an advanced defect review machine that allows for the in-depth analysis of defects, providing a comprehensive review process for quick and accurate review. This tool utilizes precise pattern recognition algorithms for the identification and classification of defects. KLA 2350 also features unique high-accuracy sample alignment mechanisms, which provide quick and accurate alignment of samples with consistent sample to sample alignment results. TENCOR 2350's proprietary analyze and review software provide high-end data management and analysis capabilities, enabling the review of defects at low levels and providing a complete inspection report. This report combines the data from both optical and defect reviews for a more comprehensive review. Overall, 2350 provides a powerful tool for ensuring quality assurance processes within semiconductor fabrication facilities. The asset is capable of quickly detecting and analyzing defects with precision accuracy, allowing for reduction of cost and improved turnaround time.
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