Used KLA / TENCOR 2350 #9250244 for sale

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KLA / TENCOR 2350
Sold
ID: 9250244
Wafer Size: 8"-12"
High-resolution imaging inspection system, 8"-12".
KLA / TENCOR 2350 Mask and Wafer Inspection Equipment is a powerful surface inspection tool used to measure complex shapes and feature sizes on masks and wafers. The system's excellent 3D measurement resolution and image processing capabilities make it an ideal choice for inspecting highly complex integrated circuit (IC) structures such as MEMS and 3D devices. KLA 2350 is designed to accurately detect a wide range of features and structure such as micro patterns, voids, contact holes, under-cut/over-cut geometries, skips, bridging and particles. It can measure various patterns including line widths down to 25nm, rounds down to 70nm, squares down to 80nm and rectangles down to 100nm. The unit can provide precise surface analysis of both square and non-square layers as well as multiple layers provided in a single wafer. TENCOR 2350 machine is equipped with a high-resolution 5µm random access scan head with 128 independent channels. Each channel can track individual tilts and collapses, ensuring accurate and repeatable measurement results. It comes with a state-of-the-art image processing software suite, specifically developed for inspecting critical structures on mask and wafer surfaces. The intuitive user interface helps users to quickly get started and easily configure and execute inspection setups. 2350 offers a high speed inspection tool to inspect a wide range of surfaces in a single pass. Its field-proven architecture produces reliable and repeatable results. The machine is powered by advanced computer algorithms that enable it to quickly detect even the most minute defects. Overall, KLA / TENCOR 2350 Mask and Wafer Inspection Asset is a reliable and powerful tool designed to provide precise, repeatable surface inspection results. It is capable of identifying even the most minute defects, making it an ideal choice for a variety of mask and wafer inspection applications.
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