Used KLA / TENCOR Archer 300 LCM #9234791 for sale

KLA / TENCOR Archer 300 LCM is a mask and wafer inspection equipment designed for quick and accurate inspection of defect disposition on thin-film microdevices. It is designed for inspection of critical defects such as crystals, cracks, and particles on 150 mm (6") and 200 mm (8") wafers. KLA Archer 300 LCM is equipped with an advanced lithography system that includes a high-resolution laser microscope (LM) and a high-resolution inspection camera. The LM has a variable-zoom range of 0.5 to 4.5mm, allowing it to accurately identify features down to 6.25µm. The inspection camera's resolution is 1.5µm with a 16-bit pixel depth, enabling easy discrimination between good and bad features. Both the LM and the camera feature advanced algorithms for defect pre-analysis, helping to reduce operator identification time. The unit can easily acquire images quickly and accurately, helping to reduce the detection cycle time. It also has built-in calibration functions that ensure accurate inspection. TENCOR Archer 300 LCM also features multiple image editing tools, enabling operators to quickly identify and measure defects that may be present. The machine is equipped with a powerful automated defect detection algorithm that recognizes and categorizes defect types automatically. This helps to reduce the need for manual inspection. The tool also records and stores images digitally for easy reference. Archer 300 LCM can connect to KLA Intellectual Property (IP) and automated failure resolution software, providing additional data review capabilities. The asset is also compatible with most third-party wafer inspection software and data analysis platforms, allowing users to view, analyze, and report results remotely. KLA / TENCOR Archer 300 LCM is a reliable, fast, and easy-to-use mask and wafer inspection model that meets and exceeds industry standards. Its high-resolution imaging and automated defect detection technologies provide thorough, accurate inspections quickly and efficiently, helping to reduce the time and cost needed for defect and quality control.