Used KLA / TENCOR Archer AIM #151422 for sale

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ID: 151422
Wafer Size: 12"
Vintage: 2006
Overlay inspection system, 12" Front end only (2) ASYST 300mm IsoPort load-ports: PN: 9700-9129-01 rev J SW ver: 5206-2702-0800 Brooks PRE-300B-U-I-CE-S2 pre-aligner: KLA PN: 0029191-000 Brooks robot handler: 3-axis, single arm, single blade / end-effecter Mini-environment with HEPA filter CE marked 2006 vintage.
KLA / TENCOR Archer AIM is an automated mask and wafer inspection equipment that has a wide array of features specifically designed to make sure that the quality and specification of a wafer are maintained. It is capable of making sure that there are no critical defects present that may jeopardize the quality of the wafer in any way. KLA Archer AIM uses advanced optics, high-quality visual inspection techniques, and superior metrology capabilities to ensure that all defects are accurately identified, quantified, and classified. This helps improve the yield of chips and reduce the risk of chip failure. TENCOR Archer AIM comes with a suite of powerful software and hardware such as the MetaSuite™, Image Coach, ProPerf, SuperTronics, BitMap, AIM-Scan, and AIMTest. The MetaSuite ™ illuminates defects in the mask and wafer patterning, while AIM-Scan uses advanced algorithms to make sure that the pattern layout is completely accurate. Image Coach is a 3D inspection tool that measures the shape and size of defects. BitMap quickly maps out defect shapes and sizes for conveyance to a database. The ProPerf is a performance module that quickly and accurately evaluates the performance of a wafer surface. The SuperTronics tool is used in conjunction with the ProPerf to ensure that the wafer's electrical characteristics are also correct. The AIMTest is a semi-automated test system that inspects the wafer after its fabrication process is complete. Archer AIM is also able to provide defect density information such as location, size, and shape. This helps identify both microscopic and macroscopic defects that could lead to yield losses. Additionally, the unit has a rich user interface and flexible customization options for visualizations, data analysis, and rapid prototyping. Overall, KLA / TENCOR Archer AIM is a powerful tool for wafer and mask inspection, as it comes equipped with features that provide high image resolution, defect analysis, and comprehensive information about the wafer. Furthermore, its high-end modular software and hardware make it a highly customizable and reliable machine.
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