Used LEICA / VISTEC MIS 200 #9266272 for sale

LEICA / VISTEC MIS 200 mask and wafer inspection equipment is a high-performance automated optical inspection system designed to detect and analyze defects in semiconductor device structures. The unit utilizes the latest in innovative imaging optical techniques and precision motion control to provide the best possible defect detection and accuracy on any process geometry. LEICA MIS 200 offers in-depth analysis of feature and pattern recognition through its dynamic image processing. The machine features a modular design that allows for a wide range of expansion options, including enhanced imaging systems, beam manipulation systems, automated metrology and peripheral devices for advanced defect mapping. It also includes a custom software package that provides selection of illumination wavelength, magnification and other tool settings. The inspection asset includes a patented inspection stage, which provides precise motion control and high accuracy defect separation capability. The model features a large field of view to capture multiple devices in a single field of view, thereby maximizing throughput and minimizing operator time. It utilizes high speed pixel shifting to minimize motion blur, allowing for accurate detection of critical defects across the entire field of view. VISTEC MIS 200 includes an advanced illumination equipment that provides the ultimate in defect detection capability. Combined with the unique dynamic image processing, it offers superior defect characterization and classification. It utilizes progressive intensity scanning, enabling detection of pattern defects, as well as random defects, resulting in better understanding of device characteristics. The system also offers a powerful defect classification engine that automatically groups and classifies defects for further review and analysis. This automated process enhances defect visibility and increases unit throughput and accuracy. In addition, an intuitive user interface provides easy access and modification of program settings and parameters. LEICA inspection machine is well-suited for semiconductor device manufacturers ranging from small fabrication labs to high-volume production settings. The tool ensures reliable operation and enhanced accuracy in both manual and automated processes. With its advanced imaging and precise motion control, it provides an efficient solution for detecting and analyzing device structure defects.