Used LEITZ Ergolux #61327 for sale

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ID: 61327
BF / DF Microscope Modulopak vertical illuminator 6"x 6" X-Y mechanical stage with glass plate Ergonomic tilting trinocular head 12V, 100W lamphouse with socket and bulb Pair of 10x WF eye pieces Motorized 5 place nose piece NPL 5x, 10x, 20x, 50x, 100x BF / DF objectives included.
LEITZ Ergolux Mask and Wafer Inspection Equipment is a specialized system used to inspect and analyze the surfaces of semiconductor masks and wafers. It incorporates advanced pattern-matching algorithms and cutting-edge optics technology to provide automated quality control and process optimization, while providing comprehensive defect detection and analysis. Ergolux Mask and Wafer Inspection Unit consists of three components; a motion control unit, an image detector, and a vision machine. The motion control unit is able to accurately control the motion of the components during the inspection process. It can also detect multiple fields of view, allowing for complete coverage of the surface. The image detector uses a one-dimensional array of detectors to capture high resolution images of up to 5 spots simultaneously. This allows for the inspection of complex patterns and the evaluation of defects present across the entire wafer surface. The detector is also capable of measuring surface features such as grain structure, isotropic etching, and surface morphology. The vision tool is an advanced optical asset that utilizes 4x dark-field optics to penetrate the surface of the wafer and detect potential defects. It contains a substantial amount of accurate reference data used for defect identification and sizing. This data is then combined with the output from the image detector to compile a comprehensive record of the wafer's characteristics. LEITZ Ergolux Mask and Wafer Inspection Model is a powerful and reliable tool for automated inspection and process optimization. Its advanced optics technology and innovative image processing algorithms allow for the accurate identification and characterization of wafer defects. By pinpointing defects with unparalleled precision, it ensures the integrity and reliability of a product prior to release. This ensures that the end product is of the highest quality and meets all industry requirements.
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