Used METRICON PC 2010 #9134609 for sale

METRICON PC 2010 is a mask and wafer inspection equipment designed and manufactured by Metronics, Inc. It is designed for wafer and mask inspection in wafer fabs and semiconductor manufacturing, as well as academic research and production related areas.The system is powered by a self-powered "smart frame," a controller/host computer, two video cameras, two monitors, and several mounting positions to accommodate a variety of components. METRICON PC-2010 is based on Metronic's advanced image processing technology, providing consistent, rapid inspection and measurements of both fine defects and wafer features. A variety of non-destructive opto-mechanical methods are used to detect patterns and contaminants on the wafer and mask surfaces. These include high-sensitivity brightfield and darkfield inspection, stereo vision inspection, line scan and image stitching. The unit has 16 bit dynamic range accuracy and uses a wide field of view to detect defects and anomalies that would be difficult to find using traditional methods. The software offers pattern recognition capabilities for better detection of process defects, as well as defect classification and reporting to facilitate the sorting and tracking of defects. It also has flexible programmable user preferences, including various display settings, various sampling modes, and a range of image processing algorithms to provide accurate and repeatable results. PC 2010 is able to handle inspections on multiple wafer sizes and multiple mask sizes, including 1.75-inch, 2.5-inch, 3.2-inch, 4-inch and 6-inch wafers. The rapid scanning speed, high resolution and adjustable working distance permit efficient and accurate inspection of high-density die and tight pitch wafers. The machine is also equipped with a wide-angle digital camera for viewing images from multiple angles, as well as a built-in CD recording mechanism for faster archiving and retrieval. In terms of safety and security, PC-2010 is compliant with National and International Safety Standards, and includes both physical and software safeguards to ensure that no unauthorized personnel are allowed access. This tool is also completely low maintenance, with only the occasional calibrations necessary to ensure accuracy and performance. Overall, METRICON PC 2010 is an advanced and reliable mask and wafer inspection asset, designed to provide accurate defect detection and classification. Its superior imaging capabilities, fast scanning speeds, and extensive pattern recognition algorithms make it an ideal inspection model for any modern semiconductor manufacturing process.