Used NAPSON RT-70 #9156821 for sale

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NAPSON RT-70
Sold
Manufacturer
NAPSON
Model
RT-70
ID: 9156821
Resistivity measurement system.
NAPSON RT-70 is an advanced mask & wafer inspection equipment designed for inspecting critical parameters in IC designs and production. It provides high accuracy, speed and repeatability for wafer bumping, alignment, lithography, metrology, and defect inspection. The system integrates a highly advanced optical sensor with a high-speed scan head and a Corvis-7 software platform. The optical sensor documents and interprets real-time data through multiple technologies, such as full-field spectroscopy and line scanning, and offers measurements of wafer topography, line and pitch, and defects. The high-speed scan head features a broad field of view and high resolution, allowing for quick on-site inspection of ICs and a significant reduction in total defect review time. The Corvis-7 software platform provides user-oriented automation of the inspection process with an intuitive graphical interface that allows easy image capture, data analysis and data export. The software also makes it possible to customize all levels of metrology parameters to accommodate customer requirements. RT-70 unit is designed to meet semiconductor industry requirements for speed, accuracy, and repeatability. With its large wafer handling capacity, the machine can inspect up to 12 wafers at once with up to eight points of focus. This ensures that all bumps, contacts, lines and features are inspected thoroughly. The tool's mask alignment capability is also exceptionally accurate and repeatable, delivering better-than-sub-45nm overlay performance. The asset is designed for cleanroom environments and complies with various international standards, including those of SEMI and MIL-STD. In addition, NAPSON RT-70 model is compatible with a variety of industry-standard inspection software packages, enabling fast integration into existing wafer processing systems. RT-70 equipment is the ideal solution for highly accurate and repeatable mask & wafer inspection applications. It combines high-precision and high-speed scan head technology, full-field spectroscopy, and intuitive GUIs for data capture, analysis, and export. With its intuitive graphical interface and semiconductor-grade features, NAPSON RT-70 system is an excellent choice for semiconductor fabrication and inspection needs.
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