Used RUDOLPH / AUGUST NSX 105 #293644486 for sale

RUDOLPH / AUGUST NSX 105 mask & wafer inspection equipment is a precision instrument used in the semiconductor industry for precise and accurate measurements of the critical dimensions of integrated circuits (ICs) and other components on printed circuit boards. The system offers precise and precise measurements at high speed. It features a combination of five components: optical unit, control machine, specimen holders, scan console and display console. The optical tool of AUGUST NSX-105 mask & wafer inspection asset consists of a state-of-the-art light detection and ranging (LIDAR) model, microscope, and charge-coupled device (CCD) camera. The LIDAR equipment uses laser technology to detect the depth of the specimens being inspected and controls the positioning of the probe tip in relation to the specimen. The microscope provides high-precision resolution for accurately viewing components on the board. The CCD camera is used for capturing a high-resolution image for offline processing. The control system of RUDOLPH NSX 105 mask & wafer inspection unit is a high-performance processing unit that communicates with the optics, specimen holder, scan console, and display console. It contains a programmable logic controller (PLC) and other necessary components to process and analyze data from the machine. The PLC is programmed to execute real-time instructions and calculations to accurately position the probe tip. The control tool also includes an auditory signal alerting inspectors to possible problems during the process. The specimen holders of NSX 105 mask & wafer inspection asset serve as the base platform for the specimen. They contain internal handles, which facilitate easy handling and movement, as well as retaining clips or locks to ensure specimen stability. The specimen holders are available in a variety of sizes to accommodate various sizes and geometries specimens. RUDOLPH / AUGUST NSX-105 scan console features a high-resolution display that allows users to view specimens being examined via the microscope. Users can also control the positioning of the probe tip and regulate specimen illumination. The display console contains controls for data input/output, specimen identification, and measurement, as well as manual and automatic calibrations. AUGUST NSX 105 mask & wafer inspection model is an all-in-one equipment designed to provide precision measurement with high accuracy and speed. The system excels due to its advanced optical and control systems, combined with robust and reliable specimen holders and ergonomic user interface. RUDOLPH / AUGUST NSX 105 efficiently inspects mask and wafer components, ensuring the production of high-quality semiconductor products.