Used TAIWAN WOS2000 #9177890 for sale

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TAIWAN WOS2000
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ID: 9177890
Wafer surface organic tester Environment VOC tester.
TAIWAN WOS2000 is an automated mask and wafer-inspection equipment intended for the optical and electrical characteristics screening of semiconductor wafers. It provides integrated solutions for the screen test and analysis of critical defects as well as the mechanical stress and temperature induced test of dies. WOS2000 offers a fully automatic image acquisition and image processing system with advanced defect detection and automatic fault analysis. The unit detects visually and electrically visible defects on the wafer with a resolution as low as 0.5um and with a greater accuracy and repeatability than manual inspections. It comprises a high-quality video camera for capturing images, a high-precision stage machine, and an advanced optical setup for exact alignment. The tool is also equipped with precise control and measurement modules for the drive and control of the motion and rotational stages, thermal measurements, light source, and others. For defect analysis, it can be programmed to detect various kinds of defects, such as edge defects, missing and over-sized features, line faults, grain boundary defects, and thermal-induced defects. It can also be used for automatic fault analysis by using the "environmental stitch space" technology. In addition, TAIWAN WOS2000 includes special tools and accessories, such as an electrical parameter measurement module which allows for the direct inspection and correlation of device electrical performance and visual and printed defects. The electrical measurement capabilities of the asset also enable optimization of model under test (SUT) performance, eliminating expensive and time-consuming manual performance testing. Additionally, it offers complete Customer Service and Support throughout the life cycle of its products with efficient and prompt response to service needs. It also offers a wide variety of software-enabled applications and features, such as automated image processing and defect analysis, SPC analysis, thermal imaging, defect sorting, process monitoring, and data analysis. In summary, WOS2000 provides a comprehensive, automated wafer inspection equipment with advanced optical and electrical characteristics screening, defect analysis functions, precise control and measurement capabilities, process monitoring, and data analysis features. It is designed to save time and cost while improving the quality of wafer products.
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