Used VEECO Dimension 3000 #9188198 for sale

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VEECO Dimension 3000
Sold
Manufacturer
VEECO
Model
Dimension 3000
ID: 9188198
Atomic force microscope (AFM).
VEECO Dimension 3000 is a scanning electron microscopy (SEM) equipment that is designed to provide exceptional imaging quality and performance for applications in semiconductor, material sciences, and life sciences. This state-of-the-art system is equipped with a variety of features which make it ideal for observing samples at the nanoscale. At the heart of the unit is the high-resolution electron column, which uses fine-steering, beam-shaping, and energy-filtering technologies to provide ultra-high precision imaging capabilities. These features allow for imaging resolutions as low as 1 nanometer (10-9 meters) and surface sensitivity of 0.7 nanometer (7x08 meters). The electron column produces a focused beam of electrons, which is then scanned across the specimen surface to create an image. Dimension 3000 also features an advanced optical machine which incorporates field emission technology to enhance the images produced by the electron column. This tool also incorporates an LED light source to illuminate the sample and allow for imaging of non-conductive surfaces with high contrast. In addition to the optical imaging features, the asset incorporates several auto capabilities, which help to simplify user operations. These features include auto-focus, which allows the user to quickly focus the microscope on the sample surface without manual intervention. Other autofocus capabilities include sample centering and scanning pattern control, which helps to ensure accurate and consistent imaging results. VEECO Dimension 3000 also features a variety of software and user interface tools which allow for image analysis and further processing. These features include line profiles, histograms, and 3D mapping. These functions help to quantify the characteristics of the sample under investigation such as shape, size, and surface topography. Overall, Dimension 3000 is an advanced scanning electron microscope which provides excellent imaging quality and performance for a variety of nanoscale applications. Its powerful electron column and optical model make it an ideal choice for high-resolution imaging and analysis of samples at the nanoscale. It also offers convenient auto-focus capabilities, software and user interface tools, and several additional options to enhance user experience.
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