Used ACCRETECH / TSK MHF 300L #9229764 for sale

ACCRETECH / TSK MHF 300L is a full-featured prober designed for semiconductor devices. This solution is capable of high speed probing and sampling operations with up to 8 samples per wafer. Its high probing accuracy and repeatability ensures reliable and repeatable measurements of device parameters. The equipment includes a compact and easy to install sub-atmosphere work chamber with a variety of features for efficient operation. The chamber includes a 300mm prober which can be used with a variety of wafer sizes without changing its parameters. The flexible sample loading system is capable of accommodating a variety of sample loading fixtures and sample devices including large and small scale ICs. This tool features an LED lighting unit for illumination with a uniform distribution of light across the entire sample. This makes it ideal for a variety of probing operations including high-precision lithography and imaging. The tool is equipped with a multi-point coarse and fine alignment mechanism which allows for speedy alignment and adjustment of the sample. The machine also includes a infrared temperature sensing tool and a thermocouple to measure temperatures up to 250°C. The integrated auto-focus asset allows for close alignment of the prober with the sample wafer. The prober can then move along the pre-programmed path to measure current, voltage, capacitance, and other electrical parameters. TSK MHF300L features a programmable binary language prober which can be easily uploaded and downloaded via a remote PC. The built-in digital interface allows for compatible operation with a variety of software platforms. The model can also communicate with other peripheral devices such as an oscilloscope or a spectrum analyzer via its built-in RS232 port. ACCRETECH MHF 300 L also features a self-test program which enables it to run a diagnostic routine and report its performance. In addition, the equipment provides data export capabilities for analysis and data archival. The enhanced fault detection capabilities enable the system to detect and identify faults in the samples much more quickly. Overall, MHF 300L is an advanced and reliable prober designed for semiconductor device testing. Its robust features and superior performance make it an ideal tool for advanced probing, sampling, and testing operations.