Used ACCRETECH / TSK UF 190A #9177317 for sale

ACCRETECH / TSK UF 190A probe station is a versatile, precision instrument used in the testing and evaluation of integrated circuits, microelectronic devices, and components. The probe station is designed for use in a cleanroom environment and is suitable for both DC and RF applications. The probe station consists of a microscope and a baseplate with adjustable probes and fixtures. The microscope is mounted to the baseplate with vibration-resistant springs, allowing it to be moved in the x, y, and z axis. The microscope has a high-resolution 5 MP color camera and features both coaxial illumination and 3D vision. The baseplate is composed of a solid base with 8"x8" stainless steel sacrificial surfaces. The base also allows for motorized motion along the three axes. It utilizes a computer-controlled stepping motor for probing and provides end-point movement along the x, y, and z axes. The adjustable probes and fixtures provide accurate probing and contact between the wafer or device and the probe station hardware. The contact force of which is adjustable and can be programmed for each test using a software interface. TSK UF 190A probe station provides the user with a highly controlled and accurate testing environment. It is equipped with a powerful, yet intuitive user interface that enables quick and easy testing of electronic devices. The user interface allows the user to control movement on the x, y and z axis, adjust the contact force as needed, and also configure other features such as velocity and acceleration. In conclusion, ACCRETECH UF 190 A probe station is a high-precision instrument ideal for testing and evaluating integrated circuits, microelectronic devices, and components in a cleanroom environment. It provides accurate and controlled testing environments with a user-friendly interface and adjustable contact force. This ensures the integrity of the device under test for optimal results.