Used ACCRETECH / TSK UF 3000 #9120847 for sale

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ACCRETECH / TSK UF 3000
Sold
Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9120847
Vintage: 2012
Prober Version: EX 2012 vintage.
ACCRETECH / TSK UF 3000 Prober is a state-of-the-art prober equipment used to characterize devices at the wafer level. The system combines a high-resolution optical microscope with a wide range of analysis and probing capabilities to accommodate both standard and high-precision probes. This allows the unit to be used for enhanced fabrication process development, yield determination, probing and production control. The machine is designed for a range of applications, including wafer inspections, thin-film measurements, localization information retrieval, die-to-die probing, sample-to-pattern analysis, and image comparison. It can also accommodate various wafer sizes, including standard 200 mm and 300 mm circular wafers, and large rectangular wafers up to 700 mm long and 200 mm wide. The tool features an advanced optical performance, including a variable spot size from 0.5 up to 6 mm, adjustable focal length from 10-280 cm, a 0.6 μm lateral resolution, and a 0.3 μm vertical resolution. It is also compatible with a wide variety of types of optical probes, including: reflected light, transmitted light, fluorescence, polarized light, defocused images, and several types of scanning microscopes. In addition to its optical performance, the asset has a wide variety of probing capabilities. It features a UF Probehead with four interchangeable, high-precision probes for probing resistance, capacitance, current, and voltage. The UF Prober can also accommodate additional probes and transducers for specialized measurements. The UF Prober also includes a number of software features designed to make data analysis easier. These include automated sample mapping, automated voltage scanning, die-to-die correlation, wafer orientation and sketching tools, and customized reporting. The model can also be operated in a variety of languages, including English, Spanish, and Simplified Chinese. The UF Prober has a number of benefits that sets it apart from other similar design and test systems. It is highly reliable and accurate, and its advanced optical performance and comprehensive probing abilities make it ideal for use in semiconductor process development, production control, and failure analysis. With its wide range of capabilities, the UF Prober is one of the most advanced prober systems on the market today.
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