Used ACCRETECH / TSK UF 3000 #9192809 for sale

ACCRETECH / TSK UF 3000 prober is a specialized, high-precision product used for testing the electrical characteristics of small microelectronic components with complicated package designs. TSK UF 3000 offers a wide range of features and functions, including high-resolution probe signal measurement, an automatic alignment function, and a variety of control modes. ACCRETECH UF3000's probe head is the core component of the system, and provides maximum precision and accuracy with a position resolution of 0.5 µm and 0.2 µm accuracy. The probe head utilizes an XYZ coordinate system and a very flexible design with four axis pneumatics allow for testing at any angle and height. It also allows for a wide range of probe topping shapes and sizes for access to any microelectronic device. The probe signal measurement feature of ACCRETECH / TSK UF3000 provides testing options that include voltage, current, contact resistance, and capacitance. The signal levels are accurately measured using a 32-bit A/D converter with a resolution of 0.25 μV. With UF3000's real-time data processing capability, time-based test parameters can be accurately measured. In addition to the probe signal measurement features, TSK UF3000 includes an automatic alignment function. This automated alignment compensates for misalignment-induced distortions of the test device's probe signals. The automatic alignment is adjustable to meet various testing parameters without requiring manual adjustment or visual confirmation. UF 3000 also has two control modes, manual and automatic, which allow users to perform a variety of procedures and repeatable tasks. Overall, ACCRETECH UF 3000 prober uses its range of advanced features and functions to offer high-precision testing of complicated microelectronic components. With its wide range of probe topping shapes and sizes, signal measurement features, automatic alignment functions, and selectable control modes, ACCRETECH / TSK UF 3000 is an excellent choice for accurate and precise testing of complex microelectronic components.