Used ACCRETECH / TSK UF 3000 #9272924 for sale

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Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9272924
Wafer Size: 12"
Vintage: 2007
Prober, 12" Chuck material: Nickel Hard Disk Drive (HDD) Floppt Disk Drive (FDD), 3.5" Magneto optical drive Head stage Single loader Loader type: FOUP and open cassette Dual robotic wafer transport arms Pre-alignment stage unit Auto needle alignment Alignment camera XY Dual HEIDENHAIN scales Color LCD control panel With touch panel switches Alarm lamp pole Options: Hot chuck: 30°C to 150°C Wafer ID recognition Needle cleaning option: Wafer type and polish plate Multi site parallel probing Fail mark inspection Probe mark inspection GPIB Interface Ethernet interface Automatic probe card changer Image processing board Bump height setting Group index Multi pass probing Printer Network: Veganet Tester and manipulator: ST MT72 CE Marked 2007 vintage.
ACCRETECH / TSK UF 3000 is a advanced prober equipment used for failure analysis. TSK UF 3000 prober combines precise positioning, high accuracy, and fast throughput to enable quick and accurate electrical probe testing for wafer-level and package-level device characterization. ACCRETECH UF3000 achieves a high accuracy of 0.5μm and a repeatability of 0.1μm, due to its brushless motors and precision linear bearings. The prober has high-resolution encoders and a high-speed encoder to maximize the positioning speed and accuracy. UF 3000 also has automatic alignment capabilities for use with complex PCB boards that have multiple sites or pins. UF3000 prober has an adaptive real-time tuning feature that allows it to dynamically adjust to any situation and maximize throughput. This feature assists in setting parameters, such as Z-Height, approach speed, and force. Additionally, ACCRETECH UF 3000 has a multi-level protection equipment that ensures the highest levels of safety and reliability for its users. The prober also features modular construction enabling custom wiring for any kind of complex testing. Automated-run-to-run control of the electronic loads provides total control of the tests, thereby eliminating any manual error. TSK UF3000 has an intuitive graphical user interface that provides access to every functionality and parameter of the system. The graphical interface can also be used to assess test results in real-time. Additionally, there is an advanced fault diagnostic unit which can be used to detect and isolate faults with the machine as well as test samples. Overall, ACCRETECH / TSK UF3000 is an advanced prober tool that can provide precise positioning, accuracy, and throughput for wafer-level and package-level device characterization. It has a multi-level protection tool for safety, modular construction for custom wiring, an adaptive real-time tuning feature, and a graphical user interface. ACCRETECH / TSK UF 3000 allows for error-free testing due to its fault diagnostic asset and automated run-to-run control of electronic loads.
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