Used ACCRETECH / TSK UF 3000EX #9194857 for sale

ACCRETECH / TSK UF 3000EX is a prober for wafer and IC testing. This prober provides precision probing and accurate measurements for a wide range of tests, with a maximum inspection area of 50 mm x 50 mm. It features an X-Y-Z motorized stage together with an advanced sample transfer system, allowing for accurate and repeatable measurements. The prober has been designed to provide a stable and repeatable inspection process and can be used to test a variety of IC products, including logic, mixed-signal, analog, RF, and optical designs. The prober offers a high resolution of the sample position and high throughput, with a great dynamic range. TSK UF3000EX has a flexible software settings and is capable of multi-probe configurations, which allows for accurate and repeatable measurements. It also has an advanced auto alignment feature which ensures accuracy and repeatability even in high-density ICs and packages. ACCRETECH UF 3000 EX also provides a wide range of test options, including time domain performance measurement, DC parametric tests, and optical probing. With the advanced configuration features and various test options, the user can customize the test parameters and program procedures to meet the specific requirements of their IC design. ACCRETECH / TSK UF3000EX is also capable of high-speed testing and has an efficient data collection management. The prober also has environmental settings for better control and accuracy in its testing environment, such as temperature, atmospheric pressure, relative humidity, and vibration tolerance. In conclusion, ACCRETECH UF 3000EX is a prober with a wide range of capabilities and flexibility that make it a great tool for wafer and IC testing. The high-precision and repeatable movements, in combination with advanced data collection management and multi-probe configurations, makes it a great choice for testing many types of designs.