Used ADVANCED INSTRUMENT TECHNOLOGY / AIT CMT-SR2000N #9218034 for sale
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ID: 9218034
Wafer Size: 8"
Automatic system, 8"
XYZ-Axis fully automatic system
High precision JANDEL P-point probe head
Auto / Manual range selection
Built-in temperature sensor
Remote control by operating PC
Data analysis (2D, 3D map)
ASTM & SEMI Quick measurement mode
Includes:
JANDEL 4-Point probe head unit
Z-Axis robot arm
Revolution sample stage chuck (XY-Axis)
Membrane keyboard panel
LCD Display window
Remote control communication port
Vacuum hose connector (200 mm Hg)
Accessories
Operating PC
Power cable & USB Cable for remote control
AIT Reference, 3"
Specifications:
Sheet resistance measurement:
Measuring method: Contacted by 4-Point probe
Measuring range: 1 mohm / sq ∼ 2 Mohm / sq
Resistivity measurement:
Measuring method: Contacted by 4-Point probe (Input thickness)
Measuring range: 10.0 μohm·cm ∼ 200.0 kohm·cm
Measurement accuracy:
± 0.5 % (Precision resistor)
JANDEL 4-Point probe
Pin spacing: 25 mils ∼ 50 mils by 5 mil increments
Pin load: 10 gram / pin ∼ 250 gram / pin
Pin radius: 12.5 micron∼500 micron (polished 2μ diamond)
Tolerance: ± 0.01 mm
Needles: Solid tungsten carbide φ0.40 mm
Measurement condition: Wafer type, measure point interval
Save & load: Data, wafer type, measure point
Data analysis: 2D, 3D Mapping, data map
On / Off: Remote, vacuum
Data export: Excel format & printout
Measurement mode:
Auto measurement: Point interval designation by user
Quick measurement: ASTM & SEMI Mode
Point measurement: Appointment on wafer by mouse
Manual measurement: Appointment on wafer by arrow key
Measuring time:
Approximately 2 ± 1 sec / point
Operating personal computer: IBM PC / AT compatible
USB Communication
Stage chuck vacuum requirements:
Vacuum: 200 mm Hg
Vacuum hose: Urethane 4 mm
Operating & service manual
Power:
Line voltage: AC 220 V ± 10%
Electric power: 40 W, 500 mA
Line frequency: 50/60 Hz
Current source:
10 nA to 100 mA
DVM 0V to 2,000 mV.
ADVANCED INSTRUMENT TECHNOLOGY / AIT CMT-SR2000N is a high precision prober for automated component testing. It is a compact, flexible and economical combination of a wafer prober and an automated component tester. This prober provides unmatched accuracy and fast, reliable data capture. AIT CMT-SR2000N is designed to test components ranging from 100 microns to 1.5 millimeters. It features a high resolution prober based on a precise piezo motor, providing up to 10 microns of displacement resolution. This prober has an advanced motion control system, providing consistent, repeatable probing accuracy with high speed processing. It can also be programmed to capture data from multiple components simultaneously. ADVANCED INSTRUMENT TECHNOLOGY CMT-SR2000N includes an advanced probe head and advanced software capabilities for testing a variety of components. It features a high stability probe head with automatic calibration and repeatable force determination, ensuring accurate results with every test. The force range of the unit is adjustable to a maximum of 10 Newtons, making it suitable for testing a variety of components. The prober can be used in combination with any computer system to control the automated component testing. It is compatible with PC based computers, providing an open platform for fast data access and control of the prober. CMT-SR2000N also features a color touchscreen display for easy visual operation. ADVANCED INSTRUMENT TECHNOLOGY / AIT CMT-SR2000N is an excellent choice for component testing in a variety of environments. Its powerful, precise, and reliable performance, along with a range of features, makes it an ideal prober for both industrial and educational laboratories. With its easy to use interface, this prober is ideal for automating any component testing process quickly and accurately.
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