Used ELECTROGLAS / EG 1034XA-6 #201048 for sale

Manufacturer
ELECTROGLAS / EG
Model
1034XA-6
ID: 201048
Wafer Size: 6"
Prober, 6" Transistor die size: ~2000-4000 µm Transistor pad size: >200 µm Substrate sheet thickness: 125-1000 µm Thermal chuck: 0-50°C, ± 1ºC Stage travel: 6.0 in/152.4 mm Travel speed: 5.0 in/sec, 127.0 mm/sec Acceleration: 1G Index range: 0005 in to 5.999 in / 0.005 mm Resolution: Index mode: 0.0005 in / 0.005 mm Jog mode: 0.00025 in / 0.006 mm Accuracy: 0.0005 in / 0.013 mm Repeatability: 0.0001 in / 0.0003 mm Dark cabinet and vision system: Camera Illuminator Monitor.
ELECTROGLAS / EG 1034XA-6 is a high-precision prober designed to meet the demands of semiconductor testing. This device is equipped with a wide range of features geared towards enhancing test accuracy and repeatability. EG 1034XA6 is capable of providing precise probing up to 150µm with high resolution electrostatic compliance and deliver speeds of up to 10kHz. Additionally, the prober supports a range of both manual and automated probe card insertion and removal capabilities. Its advanced automation enables the use of multiple stacks of different sized probe cards, enabling the flexibility to meet myriad testing needs. Programming is simplified with ELECTROGLAS 1034X-A6's unique combination of graphical user interfaces and comprehensive programming libraries. It is also outfitted with a range of user-selectable vision and lighting options, providing optimum visibility of the test site. EG 1034X-A6 is constructed for maximum stability and precision with a double deck configuration, reinforced high density graphite plate, and an automated X/Y/θ motorized stage with a height range of 6 millimeters to 12 millimeters. It also incorporates a precision align-to-target capability to aid in accurate alignment of the tip to the test site. To protect against contamination, the prober is equipped with a high performance ionization and filtration system. Additionally, it features an intuitively designed ergonomic operator station and foot switch to improve comfort and minimize operator fatigue. As an option, EG 1034XA-6 can be furnished with the required system power, control, and communication electronics, helping to reduce installation and setup time. This makes the prober an ideal choice for applications such as high speed wafer sorting and final-test burn-in.
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