Used TEL / TOKYO ELECTRON P-8 #293609216 for sale

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Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293609216
Wafer Size: 8"
Prober, 8" Monitor Stage: Chuck top Indexer: Indexer set switch Manipulator MVME Rack: 147CON IP DP 316 QMC3 SIO GPIB Loader: Sub chuck Pincette (Upper) Pincette (Lower) Solenoid Wafer sensor Vacuum sensor Loader interlock Utility: LST PST-STD PST-OPT LST-1 LST-2 Inter connect 1 Inter connect 2 Alarm control SACC: R/I-photo sensor Rotary switch Tray-photo sensor Control board.
TEL / TOKYO ELECTRON P-8 is a prober designed to be used in semiconductor process development and device characterization. It is a fully automated measurement system incorporating a high-performance prober, controller and specialized software. TEL P8 features full positioning accuracy, high-precision flatness and rigidity, high-speed movements and reliability that can be expected from TEL. TOKYO ELECTRON P 8 prober is equipped with a precise motion control system, featuring an integrated encoder for precise positioning and a motor for precise speed positioning of the prober. It also incorporates advanced prober technology to ensure precise positioning, full coverage of the device under test, flatness, rigidity and reliable performance. P8's tilting head allows for precise positioning regardless of device pad polarity and precise alignment of the measurement port during probing. TEL / TOKYO ELECTRON P 8 is also designed to be mated to numerous types of process tools, including various die-bonding tools and different types of measuring tools. Additionally, TOKYO ELECTRON P8 is compatible with TOKYO ELECTRON measurement tool interfaces and allows for easy installation, operation and maintenance. TEL P 8 prober is highly accurate and capable of moving at a rate of up to 17 Millimeters per second. Additionally, the dual tip design allows for improved scanning accuracy over multiple, different sized devices and varied pad configurations. This prober also includes a multifunctional pad, which allows for contact testing of three different types of ICs at once. P 8 prober is powered by specialized prober software specifically designed for TEL P-8 model. This software includes probing algorithms that are optimized for small and large die, as well as varied pad configurations. These algorithms improve measurement accuracy and enable the device to monitor chip (die) height and temperature while probing. TOKYO ELECTRON P-8 is designed to provide a high degree of accuracy, allowing users to take reliable measurements. Its robusting construction and wide array of features make it suitable for a variety of testing and measurement applications, making it the ideal prober for use in semiconductor process development and device characterization.
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