Used TEL / TOKYO ELECTRON P-8 #9238931 for sale

TEL / TOKYO ELECTRON P-8 is a prober equipment that is widely used in semiconductor-manufacturing industries. It is designed to provide accurate and reliable measurements of semiconductor device parameters such as electrical testing and contact resistance. Specifically, TEL P8 prober can be used for wafer level contact probe measurements for wafer-level device characterization, including high-frequency (HF) electrical testing. Additionally, its automated contact probe systems are applicable for measuring electrical and contact resistance of semiconductor wafers including polishing and metallization tests. TOKYO ELECTRON P 8 prober is designed to provide a wide range of device measurements with stable electrical environment and advanced functionality. It features multiple prober stages to accommodate different wafer types, including silicon and compound materials. Its contact stages are optimized to provide reliable contact forming and plasma-induced deposition, while its probe mechanism ensures repeatable contact tip positioning. Additionally, its well-designed probe-holder solution offers a wide range of test stand configurations to fulfil the unique needs of specific semiconductor devices. The prober system is equipped with various tools analyses, such as the automated OCR scanning and image capture tool that allows users to quickly inspect devices during testing. Additionally, the unit provides an interactive graphical user interface to allow users to interactively visualize and modify their testing scenarios. Moreover, it enables automated wafer exchange to directly exchange wafers between TEL host and the prober for fast test/trim/pack operations. TEL / TOKYO ELECTRON P 8 prober also features advanced laser-based measurements. Multiple channel ovens can be modified for device-specific testing scenarios and temperature management, while its advanced parametric testing suite allows users to capture both parametric and functional influences at the same time. Additionally, its probe card machine is designed to protect against electromagnetic interference and allows multiple contacts to be made in parallel for faster testing and accurate measurement. TEL / TOKYO ELECTRON P8 is a reliable and feature-rich prober tool that is suitable for use across a wide range of semiconductor fabrication and test operations. Its advanced tools and technologies allow users to obtain accurate and consistent results, while its advanced temperature, probe, and laser-based tests enable users to capture both parametric and functional influences at the same time.