Used TEL / TOKYO ELECTRON P-8XL #9261135 for sale

TEL / TOKYO ELECTRON P-8XL is a prober equipment designed to measure and monitor semiconductor devices, such as integrated circuits (ICs) or transistors. This state-of-the-art prober system enables high-precision, automated probing of semiconductor devices for many different testing purposes. It uses a dielectric pad to form an electrical connection between the device and an external measurement circuit. The prober unit supports measurements of both DC and AC properties of semiconductor devices. TEL P8XL utilizes a powerful wafer probing station with a large 12-inch (30.5cm) touchscreen. This display offers a high-quality, interactive interface to set up the measurement equipment, control the parameters, and supervise the testing operations. The touchscreen also facilitates the full-scale automated wafer measurement from die selection, loading/unloading, and prober alignment. TOKYO ELECTRON P8-XL is able to accurately measure DC and AC properties of a wide variety of semiconductor IC devices. It can be used with any type of IC device and it is compatible with all common test techniques. This prober machine features multi-site precision probing and advanced die-to-die verification. Its high-resolution automated measurement capabilities can measure a variety of parameters such as Vt, Rds(on), leakage, and thermal resistance. TEL P-8XL offers high productivity with its broad feature-set. It supports improvements in device performance with its wafer-level testing accuracy and high-speed probing rate. P8XL prober tool is also highly reliable and efficient due to its robust design and maintenance. In addition, the prober asset is ergonomically designed, with convenient user operation, so it is comfortable to use. Overall, TEL P8-XL prober model is a great tool for testing semiconductor devices at a high level of accuracy, convenience, and reliability. It is a reliable and easy-to-use prober equipment that provides accurate and precise measurements of a wide variety of semiconductor ICs. It is designed for high productivity and works with all common test techniques, making it a great option for semiconductor device manufacturing operations.