Used AMAT / APPLIED MATERIALS Semvision ADC Server #9154741 for sale

AMAT/AMAT / APPLIED MATERIALS Semvision ADC Server is an automated mask and wafer inspection equipment designed to provide the highest level of performance in the semiconductor industry. The system is based on a dual-headed optical microscope that operates within a vacuum chamber to safely inspect and analyze wafers, masks and associated photomasks. The unit utilizes advanced image processing algorithms to detect defects on the specimens with a high degree of accuracy. It is capable of inspecting a wide variety of geometries and sizes of substrates, as well as performing a number of specialized analysis tasks such as thickness measurement and feature analysis. Additionally, defect classification and classification by location are also supported by the machine. The tool is available in a variety of configurations to meet the production requirements of the specific application in question, ranging from the basic manual configuration to more complex automated systems. It offers a range of features that can be tailored to the user's unique needs. These include high resolution imaging, a large depth of focus, automated chromatic aberration correction, and automated wafer levelling. The asset is equipped with a "smart" visual inspection software package, enabling it to detect complex patterns and generating comprehensive "smart" defect masks quickly and accurately. It also incorporates defect data reporting and maintenance features to maximize performance and user-friendly operation. Digital signal processing can be used to detect low-contrast defects, and any signal shortcomings can be compensated for using the model's virtual window functionality. The equipment also features built-in mask and wafer surface inspection algorithms to help identify potential damage or contamination of the specimens. Manual and automated stage moves are also available for further investigations and analysis. The system also includes a host of in-situ optical measurement capabilities including edge and area mapping, quantitative surface analysis, overlay measurement, and resolution enhancement. The unit is available in several formats and provides a wide range of upgradability and flexibility, allowing for upgrading over time to meet the changing needs of the production environment. A wide range of accessories and support materials is also available for the machine, including a range of microscopy-specific accessories, imaging packages, and support materials. AMAT Semvision ADC Server from APPLIED MATERIALS/AMAT / APPLIED MATERIALS provides a high-performance automated mask and wafer inspection tool that is designed to deliver fast and accurate results in a safe and controlled environment. With its wide range of features and flexible configuration options, the asset can be tailored to suit the precise needs of any mask or wafer inspection application.