Used CAMBRIDGE S 200 #9034861 for sale
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ID: 9034861
SEM
Windows 7 upgrade
Scanning system DISS 5 standard edition/communication USB 2.0
Hardware: X-/Y-scan, 2 analog signal inputs without counter inputs
Software: without mapping and enlarged point measurement/line scan
19" rack (containing the electronics), 10 HU without housing,
without desk
Backplane and power logic with interlock system
Central USB 2.0 interface for control and communication
Plug-in card with 8 bipolar current sources
(Beam alignment, image shift, stigmator)
Plug-in card with X-/Y-scanning power amplifier / current sources
(Magnification coarse/fine, scan rotation, tilt correction X/Y filament image)
Plug-in card for objective and 2 condensor lenses / power current sources (focus coarse, fine, spot size)
Plug-in card with 8 analog unipolar/bipolar control outputs /voltage (gun: HV, filament emission, SE: contrast, brightness, grid; aux: contrast brightness)
2.9. Power supplies for electronics, lenses and coils
SE-amplifier module
(Amplifier with offset; adjustable 1,5 kV for PMT, power supply SE-preamp
SE-high voltage module
(10-12 kV scintillator-high voltage and adjustable grid voltage
Control module for gun-high voltage of SEM
(Control of HV, filament, emission, emission current measurement, optional: power supply)
Adaption of the vacuum and HV interlock of the SEM to the
interlock-system of the SEM-upgrade (Vacuum-gun-HV-interlock; Stage SE-HV-interlock)
19" rack fitting in the SEM housing
Schottky Thermal Field Emission (TFE) source
Point-to-point Resolution of <3nm*
High Beam Current. (10pA to >100na)
Improved low voltage (1kV) performance
TFE “Schottky” Source PC controlled.
Reduced Downtime and Cost of Ownership
Fully reversible AND transferable upgrade Kit for variety of Tungsten (W) SEM models including JEOL, Hitachi,
FEI, Zeiss and others.
External and internal magnetic shielding
30 KeV Schottky Field Emission Source Mechanical Assembly:
x1 Thick walled stainless steel chamber
One Schottky Field Emission Gun Unit
Differential pumping tube and UHV valve
Internal mu-metal shield
55 I/s ion pump and power supply (optional)
External mu-metal shield
YPS High Voltage Power Supply:
Remote high voltage supply unit with:
Fibre optic link
High voltage cable with Discharge Management
YPS Schottky Field Emission Gun Unit:
Pre-aligned™ YPS Schottky field emission module (HV-30)
YPS Software Interface:
USB interfaced fibre optic output to the remote YPS HV power supply
Software from the system PC to controland monitor the Schottky field emission module.
CAMBRIDGE S 200 is a scanning electron microscope (SEM) used for imaging and analysis of tiny objects. It has the ability to produce incredibly high-resolution images with resolution as low as one nanometer. The main components of CAMBRIDGE S-200 include an electron source, an accelerating column, a Faraday cage, a deflector, a scanning generator, a high-tension power supply, and a digital image detector. The electron source is a fine filament that emits electrons, which then travel down the accelerating column. After this, the electrons pass through the deflector which deflects the beam to the sample region. The scanning generator produces a deflected beam in the sample region, allowing for the creation of a raster image of the sample surface. Once these scans are completed, a signal is sent to the image detector which converts the optical signal into electrical signals and sends it to the display. S 200 has a number of features that make it an ideal choice for applications which require high-resolution imaging and analysis. Its ultra-high vacuum system allows for operation at an extremely low pressure, ensuring that the sample is not damaged by the electron beam. Additionally, its energy filter helps to reduce beam broadening and to produce a higher resolution image. It also has an integrated image enhancement system which assists with noise reduction and contrast enhancement. S-200 has an advanced specimen stage which allows for automation of specimen navigation and positioning. This makes it possible to image specimens without user interaction. The stage also has a range of features such as variable acceleration voltage, sample tilt and sample rotation, making it suitable for virtually any imaging or analysis task. CAMBRIDGE S 200 features an intuitive user interface allowing for easy navigation, operation, and control of the microscope. It also has an advanced software system which offers live tracking, automation, and quantitative analysis of specimen images. This makes CAMBRIDGE S-200 suitable for a wide variety of applications such as nanoscale metallography, materials analysis, failure analysis, and grain size measurement. Overall, S 200 is an advanced scanning electron microscope with the ability to produce extremely high-resolution images. Its advanced features allow for automated specimen positioning, intuitive operation, and quantitative analysis, making it an ideal choice for a variety of applications.
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