Used FEI Inspect-F #9284147 for sale

FEI Inspect-F is a scanning electron microscope (SEM) system which is specifically designed for structurally analysing and examining a variety of materials and semiconductor devices. Inspect-F offers low-voltage imaging capabilities that provide an array of options including backscattered electron imaging, secondary electron imaging, and cathodoluminescence imaging. The low-voltage imaging helps to provide detailed images of the specimens' surface layers, enabling imaging of ultra-thin specimens which are too small for normal SEMs. FEI Inspect-F has superior resolution of up to 1nm, a feature that allows magnified views to be taken of a material's nanoscale features. It also equipped with a digital signal processor which helps in recording and processing images quickly. In terms of accuracy, this SEM has an automated solid-state drift correction system which helps to keep the position of the specimen dentrogride accurate at different magnifications; this helps to maintain positioning accuracy for imaging and increases the speed of sample analysis. The instrument features a load-lock chamber coupled with an automated exchange station, giving the user a wide variety of options for handling and analyzing samples. This includes things like sample selection, cleaning, and preparation. The sample chamber can be cooled or heated to ensure the sample is always maintained within the optimal operating parameters while being viewed. Inspect-F includes a variety of advanced imaging options such as automatic feature detection, image stitching, 3D imagery, and more. This helps to provide a more detailed understanding of the specimen being analyzed. For research purposes, FEI Inspect-F includes a wide range of analytical tools such as electron beams, electron detectors, signal processing systems, image processing software, and more. With these, users can map out even the most minuscule details of a specimen's features. Inspect-F is an advanced and powerful tool which provides a thorough analysis and examination of any specimen. This scanning electron microscope has a variety of advanced features and imaging tools that increase the accuracy of data obtained and the speed of specimen analysis. Its features, combined with its extraordinary resolution of up to 1nm, make this instrument a must-have for any researcher seeking to explore the intricate details of materials and devices.