Used FEI Nova NanoSEM 230 #9397633 for sale
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ID: 9397633
Vintage: 2006
Scanning Electron Microscope (SEM)
Detector:
ETD
TLD
EDX
2006 vintage.
FEI Nova NanoSEM 230 is a high resolution scanning electron microscope (SEM). Based on the ingenious design principles of FEI Field Emission Electron Optics, the NanoSEM offers improved performance levels for imaging, analysis, and microscopy capabilities in nanotechnology related fields. In terms of hardware, Nova NanoSEM 230 is capable of providing magnification from 1kx to 300kx and utilizes a launching power of 0.5-30kV.The large dynamic range of the imaging system enables intricate surface features to be easily distinguished while also allowing the investigation of larger features such as nanoparticles. By virtue of its variable accelerating voltage and spherical aberration corrector functionality, the system is able to provide fast, detailed images of small scale features posed in a specific orientation to provide the operators with a comprehensive view of their sample. Utilizing both secondary electrons and backscattered electrons, the NanoSEM offers four detection modes, accordingly allowing a variety of analytical tasks to be carried out. The equipment's imaging capabilities are further enhanced by its Drift Correction Algorithm (DCA), which automatically corrects any deflections in the SEM's specimen positioning during imaging to ensure steady results.Furthermore, NanoSEM's advanced Detector Misalignment Compensation feature minimizes blurring and distortion in images for accurate imaging even at higher magnifications. The SEM is designed to be user-friendly, with intuitive touchscreen operation. Control is provided by the software FEI FEGSEM v2 , which integrates SEM automated operation with powerful imaging and analysis capabilities. In sum, FEI Nova NanoSEM 230 is an excellent choice for experts in nanotechnological fields, providing a combination of high power, resolution and accuracy that no other system can match. As such it offers a robust platform to view, analyze and interpret complex material samples on the nanometric scale.
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