Used HITACHI IS 3200SE #293636293 for sale

HITACHI IS 3200SE is a scanning electron microscope, built by HITACHI High Technologies, that allows users to observe fine samples from electron beams in the form of images at a high magnification of up to 300kx. It is often used for metallurgical applications and for failure analysis, but is also capable of observation of organic samples. This device features a shared column design, in which the secondary electron detection, backscatter and X-ray detectors are integrated into a single chamber. This allows for efficient capture and observation of samples, even at lower magnifications. An integrated cathode-lensed electron gun generates opposite charges of electrons to the sample, compensating each other and creating a stable imaging field. IS 3200SE also boasts an image acquisition speed up to three times faster and a 160nm resolution, allowing users to acquire images beyond what is possible with a standard scanning electron microscope. Its circuit design is robust and efficient, which makes it easy to use and maintain, while advanced energy filters reduce the time for sample preparation. The scan depth of HITACHI IS 3200SE is large and its spatial resolution small. This enables it to provide excellent image uniformity and cleanliness, allowing for highly detailed observation at a low magnification, producing multiple views of samples from different angles. As a result, users are able to gain a better understanding of the structure and composition of samples. To add to these capabilities, IS 3200SE has an automated chip recognition feature. This feature allows users to locate specific chips and other components with great ease, enabling fast, accurate detection and analysis. Furthermore, its environmentally friendly digital architecture provides the user with a low maintenance cost, which helps reduce consumables and energy usage. In conclusion, HITACHI IS 3200SE is an efficient and easy to operate scanning electron microscope that offers superior image resolution and detail at low magnifications, while providing a rapid and cost effective analysis of samples. Its high quality of images, along with its automated chip recognition feature, ensures users a convenient way of obtaining detailed results from high magnification observation.