Used HITACHI IS 3200SE #293672029 for sale

HITACHI IS 3200SE Scanning Electron Microscope (SEM) is an fifth-generation SEM equipment designed for the analysis of ultra-small samples, enabling high resolution imaging with superior beam stability and integrity over a wide range of pressure and temperature conditions. IS 3200SE SEM delivers unprecedented automation, sensitivity, magnification, resolution, and clarity. State-of-the-art deflector design and high-level system technologies guarantee greater flexibility and usability, as well as improved imaging accuracy. HITACHI IS 3200SE offers a variety of features including sample size and temperature compatibility, high acceleration voltage, advanced semiconductor-level imaging, and high-fidelity imaging. The unit also includes advanced image analysis functions and fully automated sample stages which ensure that all measurements are accurately and precisely obtained. IS 3200SE's high-speed scanning and high-resolution imaging technology enable users to resolve and analyze sub-micron structures with the highest degree of precision. The machine is equipped with a high-precision stage, causing minimal vibration and ensuring the stability of the image acquisition. With its stable performance, HITACHI IS 3200SE is ideal for electron diffraction, nanofabrication, and nanoautomation applications. Furthermore, IS 3200SE features an electrically conductive specimen stage capable of holding highly conductive, non-magnetic specimens such as semiconductor wafers. The stage also enables stable imaging and stage scanning in order to acquire accurate measurements. HITACHI IS 3200SE is designed to provide users with maximum flexibility in terms of sample finish and size. It is equipped with an automated sample exchange tool as well as a wide range of sample holders and accessories to accommodate a variety of sample sizes and types. Finally, IS 3200SE allows users to conduct detailed and comprehensive scanning electron microscopy. The asset is highly effective in applications such as metal-oxide-semiconductor (MOS) device fabrication and material analysis. Its unique design also allows users to customize imaging parameters based on their specific needs. Overall, HITACHI IS 3200SE Scanning Electron Microscope offers the latest technological advances in SEM analysis, allowing users to achieve unprecedented imaging accuracy and flexibility. It is ideal for high-resolution imaging, automation of complex measurements, electron diffraction, and nanoautomation applications.