Used HITACHI IS 3200SE #9378719 for sale

HITACHI IS 3200SE
ID: 9378719
Brightfield inspection system.
HITACHI IS 3200SE Scanning Electron Microscope is one of the latest models by leading manufacturer HITACHI. Boasting superior image resolution, versatility, and superior signal-to-noise sensitivity over legacy models, this advanced microscope offers high-quality imaging in a range of fields. It uses a field emission electron source and a large rectangular acceleration field to generate high-resolution images. Its probes are designed to be highly efficient, able to perform in a wide range of materials and environment. The large stage allows for even wider sample coverage and its tilt range makes it suitable for specimen observation in various angles. Also, its large working distance and low expansion rate enable it to be utilized in a wide variety of applications. Its superior signal-to-noise performance and resolution make it ideal for a range of materials and environmental conditions. These features make it an excellent choice for imaging both semiconductor and life science samples. The microscope features an adjustable blue LED backlight system for viewing samples on flat samples. It also includes a built-in XYZ stage for controlling to sample position, allowing for precise sample positioning. This system is combined with top-class optics and electronic components for the best possible image capture. The automatic shutter and condenser shutter further helps to ensure high sample stability. IS 3200SE also has an auto alignment function, which produces traceable results with automatic sample centring and alignment. This feature makes it convenient to automatically and accurately align samples without the need for user intervention. The microscope is integrated with several software packages to control experiment parameters, helping to create detailed images and data quickly and easily. This feature also supports remote control, enabling users to monitor their experiments on the go. Overall, HITACHI IS 3200SE is an advanced, user-friendly scanning electron microscope designed to help deliver top-class images and results. With a feature-rich system and capable of high-resolution imaging, it is an ideal choice for imaging both semiconductor and life science samples.
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