Used HITACHI NE-4000 #9260762 for sale
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ID: 9260762
Vintage: 2011
Electron Beam Absorbed Current (EBAC) characterization system
Driving method: Piezoelectric
Fine stroke range: 5 µm (X,Y)
Coarse stroke range: 6 mm (X,Y)
Specimen stage / Base stage
Specimen size: 25 mm × 25 mm × 1 mm Thick or less
Traverse position: Measurement / Specimen exchange position
Specimen exchange: Air-locked exchange chamber
Prober navigation:
Stage traverse to probe position
Measurement position memory
Probe coarse adjustment:
CCD Image display: Image display from lateral direction
Electron optics:
Electron gun: Cold field emission electron source
Accelerating voltage: 0.5 kV to 30 kV
Resolution: 15 nm (at 2 kV, WD: 15 mm)
Image shift: ±150 µm (at 2 kV, WD: 15 mm)
EBAC Amplifier / Image display:
Amplifier type: Current amplifier / Differential amplifier
Image display: SEM / EBAC (Single / Parallel / Overlay)
Image processing:
Black and white reversal display
Color display
Brightness adjustment
Slow scan integration
Belt scan
Utility:
Room temperature: 15°C - 25°C
Humidity: 60% RH or Less
Grounding: 100Ω or Less
Power supply: AC 100 V, ±10% 5 kVA (M5 Crimp terminal)
2011 vintage.
HITACHI NE-4000 is a scanning electron microscope (SEM) designed for use in research and industrial analysis. The equipment is equipped with a digital tomograph, providing excellent magnification levels and a wide variety of imaging capabilities. With the high-resolution scanning capabilities and an integrated image analysis system, NE-4000 is capable of precise imaging of microstructures with a resolution of up to 0.35nm. The microscope has a purpose-built objective lens, which is designed to maximize imaging effectiveness and performance. An ultra-high frequency power signal supply is provided for the electron beam, to ensure stability and reproducibility. Other features of the microscope include a specimen coat discharge source, a sample chamber with a maximum temperature of 540°C, an in-column beam blanker, and an electron gun control unit. HITACHI NE-4000 unit also features a fully automated specimen handling machine, which can be used to mount and introduce the specimens for analysis. This tool allows the user to make high-resolution scans of the specimen with precise control over the specimen position and magnification. With the automated asset in place, the microscope can be used for a range of applications such as mapping, 3D imaging, correlative microscopy, and more. The model's high-precision imaging performance is further enhanced by the use of a CCD camera equipment, which is connected directly to the microscope. This system is capable of capturing digital images of up to 25 megapixels with an impressive level of detail. The images are also easy to process, as the unit is compatible with a variety of software packages for image analysis and manipulation. NE-4000 machine is also equipped with a range of signal-processing, imaging, and measurement tools such as a high-speed scanning stage, intelligent image processing, and high-resolution digital imaging to improve imaging performance. Furthermore, the microscope is also capable of displaying 3D images in real-time, which makes the tool particularly suitable for industrial inspection and research laboratory applications. Overall, HITACHI NE-4000 is the ideal choice for high resolution imaging of microstructures at nanometre level. With its range of advanced imaging capabilities and automated specimen handling, it is able to provide precise images with excellent levels of detail and accuracy. The asset has been designed to be user-friendly and easy to use, making it a great choice for both research and industrial applications.
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